Surface-induced p-type conductivity in ZnO nanopillars investigated by scanning probe microscopy

Journal of Applied Physics

Volumn 107, Issue 12, 2010, Pages

  Latu Romain, E ^a   Gilet, P ^a   Chevalier, N ^a   Mariolle, D ^a   Bertin, F ^a   Feuillet, G ^a   Perillat Merceroz, G ^a   Ferret, P ^a   Levy, F ^a   Muret, P ^a   Chelnokov, A ^a  

^a CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL DIAMETER; ELECTRICAL BEHAVIORS; ELECTRICAL TRANSPORT; I - V CURVE; NANOPILLARS; OUTER SHELLS; P-TYPE; P-TYPE CONDUCTIVITY; SCANNING CAPACITANCE MICROSCOPY; SCANNING SPREADING RESISTANCE MICROSCOPY; SPACE CHARGE REGIONS; SURFACE BARRIER; SURFACE STATE; SURROUNDING ENVIRONMENT; VOLTAGE BIAS; ZNO;

PROBES; SCANNING; SCANNING PROBE MICROSCOPY; TRANSPORT PROPERTIES; ZINC OXIDE;

PLASTIC COATINGS;

EID: 77954186622     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3436596     Document Type: Article

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