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Volumn 96, Issue 22, 2010, Pages

Persistent photoconductivity due to trapping of induced charges in Sn/ZnO thin film based UV photodetector

Author keywords

[No Author keywords available]

Indexed keywords

DARK CONDUCTIVITY; EXCESS CARRIERS; INDUCED CHARGES; METAL INTERFACE; PERSISTENT PHOTOCONDUCTIVITY; PHOTOEXCITED ELECTRONS; PHOTORESPONSES; RECOMBINATION CENTERS; RF MAGNETRONS; TRAP CENTER; TRAPPED CHARGE; ULTRA-THIN; UV PHOTODETECTORS; VALENCE-BAND HOLES; ZNO; ZNO THIN FILM;

EID: 77953571587     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3427417     Document Type: Article
Times cited : (59)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.