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Volumn 13, Issue 4, 2013, Pages 1549-1554

Utilizing the unique properties of nanowire MOSFETs for RF applications

Author keywords

1 D transport; Ballistic transport; linearity; nanowire transistor; quantum capacitance; RF CMOS; transconductance

Indexed keywords

1-D TRANSPORT; BALLISTIC TRANSPORTS; LINEARITY; NANOWIRE TRANSISTORS; QUANTUM CAPACITANCE; RF-CMOS;

EID: 84876014176     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl3047078     Document Type: Article
Times cited : (10)

References (32)
  • 2
    • 21244435194 scopus 로고    scopus 로고
    • Novel constant transconductance references and the comparisons with the traditional approach
    • Chen, J.; Shi, B. Novel constant transconductance references and the comparisons with the traditional approach Southwest Symp. Mixed-Signal Des. Feb. 2003, 104-107
    • (2003) Southwest Symp. Mixed-Signal Des. , pp. 104-107
    • Chen, J.1    Shi, B.2
  • 4
    • 4544265518 scopus 로고    scopus 로고
    • RF Circuit Implications of Moderate Inversion Enhanced Linear Region in MOSFETs
    • Toole, B.; Plett, C.; Cloutier, M. RF Circuit Implications of Moderate Inversion Enhanced Linear Region in MOSFETs IEEE Trans. Circuits Syst. 2004, 51 (no. 2) 319-328
    • (2004) IEEE Trans. Circuits Syst. , vol.51 , Issue.2 , pp. 319-328
    • Toole, B.1    Plett, C.2    Cloutier, M.3
  • 5
    • 4344560248 scopus 로고    scopus 로고
    • A linearization technique for RF low noise amplifier
    • Xin, C.; Edgar, S. A linearization technique for RF low noise amplifier Int. Symp. Circuits Syst. 2004, 4, 313-316
    • (2004) Int. Symp. Circuits Syst. , vol.4 , pp. 313-316
    • Xin, C.1    Edgar, S.2
  • 7
    • 36749016893 scopus 로고    scopus 로고
    • An accurate behavioral model for RF MOSFET linearity analysis
    • DOI 10.1109/LMWC.2007.910518
    • Kwon, I.; Lee, K. An Accurate Behavioral Model for RFMOSFET Linearity Analysis IEEE Microwave Wireless Components Lett. 2007, 17 (no. 12) 897-899 (Pubitemid 350210531)
    • (2007) IEEE Microwave and Wireless Components Letters , vol.17 , Issue.12 , pp. 897-899
    • Kwon, I.1    Lee, K.2
  • 8
    • 0036564670 scopus 로고    scopus 로고
    • Linearity and low-noise performance of SOI MOSFETs for RF applications
    • DOI 10.1109/16.998598, PII S0018938302043307
    • Adan, A. O.; Yoshimasu, T.; Shitara, S.; Tanba, N. Linearity and Low-Noise Performance of SOI MOSFETs for RF Applications IEEE Trans. Electron. Devices 2002, 49 (no. 5) 881-888 (Pubitemid 34658949)
    • (2002) IEEE Transactions on Electron Devices , vol.49 , Issue.5 , pp. 881-888
    • Adan, A.O.1    Yoshimasu, T.2    Shitara, S.3    Tanba, N.4    Fukumi, M.5
  • 9
    • 79959466641 scopus 로고    scopus 로고
    • Study of RF Linearity in sub-50 nm MOSFETs Using Simulations
    • Ma, W.; Kaya, S.; Asenov, A. Study of RF Linearity in sub-50 nm MOSFETs Using Simulations J. Solid-State Electron. 2004, 2 (no. 2-4) 347-352
    • (2004) J. Solid-State Electron. , vol.2 , Issue.2 , pp. 347-352
    • Ma, W.1    Kaya, S.2    Asenov, A.3
  • 10
    • 3142741914 scopus 로고    scopus 로고
    • Impact of Device Physics on DG and SOI MOSFET Linearity
    • Ma, W.; Kaya, S. Impact of Device Physics on DG and SOI MOSFET Linearity J. Comput. Electron. 2003, 48 (no. 10-11) 1741-1746
    • (2003) J. Comput. Electron. , vol.48 , Issue.10-11 , pp. 1741-1746
    • Ma, W.1    Kaya, S.2
  • 11
    • 79958849168 scopus 로고    scopus 로고
    • Improved linearity performance of AlGaN/GaN MISHFET over conventional HFETs: An optimization study for wireless infrastructure applications
    • Aggarwal, R.; Agrawal, A.; Gupta, M.; Gupta, R. S. Improved linearity performance of AlGaN/GaN MISHFET over conventional HFETs: An optimization study for wireless infrastructure applications SuperLattices Microstructures 2011, 50 (no. 1) 1-13
    • (2011) SuperLattices Microstructures , vol.50 , Issue.1 , pp. 1-13
    • Aggarwal, R.1    Agrawal, A.2    Gupta, M.3    Gupta, R.S.4
  • 12
    • 2442488943 scopus 로고    scopus 로고
    • Optimization of RF Linearity in DG-MOSFETs
    • Kaya, S.; Ma, W. Optimization of RF Linearity in DG-MOSFETs IEEE Electron Device Lett. 2004, 25 (no. 5) 308-310
    • (2004) IEEE Electron Device Lett. , vol.25 , Issue.5 , pp. 308-310
    • Kaya, S.1    Ma, W.2
  • 15
    • 0024011864 scopus 로고
    • Spatial variation of currents and fields due to localized scatterers in metallic conduction
    • Landauer, R. Spatial Variation of Currents and Fields due to Localized Scaterers in Metallic Conduction IBM J. Research Deviation 1988, 32 (no. 3) 306-316 (Pubitemid 18646318)
    • (1988) IBM Journal of Research and Development , vol.32 , Issue.3 , pp. 306-316
    • Landauer, R.1
  • 16
    • 58149215952 scopus 로고    scopus 로고
    • Characteristic Features of 1-D Ballistic Transport in Nanowire MOSFETs
    • Lundstrom, M. S. Characteristic Features of 1-D Ballistic Transport in Nanowire MOSFETs IEEE Trans. Nanotechnol. Nov. 2008, 7 (no. 6) 787-794
    • (2008) IEEE Trans. Nanotechnol. , vol.7 , Issue.6 , pp. 787-794
    • Lundstrom, M.S.1
  • 17
    • 46049119669 scopus 로고    scopus 로고
    • Ultra-Narrow Silicon Nanowire Gate-All-Around CMOS Devices: Impact of Diameter, Channel-Orientation and Low Temperature on Device Performance
    • Singh, N. Ultra-Narrow Silicon Nanowire Gate-All-Around CMOS Devices: Impact of Diameter, Channel-Orientation and Low Temperature on Device Performance Int. Electron Devices Mtg Dec 2006, 548-551
    • (2006) Int. Electron Devices Mtg , pp. 548-551
    • Singh, N.1
  • 19
    • 3042798259 scopus 로고    scopus 로고
    • Multimode Transport in Schottky-Barrier Carbon-Nanotube Field-Effect Transistors
    • Appenzeller, J.; Knoch, J.; Radosavljević, M.; Avouris, P. Multimode Transport in Schottky-Barrier Carbon-Nanotube Field-Effect Transistors Phys. Rev. Lett. 2004, 92 (no. 22) 1-4
    • (2004) Phys. Rev. Lett. , vol.92 , Issue.22 , pp. 1-4
    • Appenzeller, J.1    Knoch, J.2    Radosavljević, M.3    Avouris, P.4
  • 22
    • 33847735448 scopus 로고    scopus 로고
    • Bandstructure and Orientation Effects in Ballistic Si and Ge Nanowire FETs
    • Wang, J.; Rahman, A.; Klimeck, G.; Lundstrom, M. Bandstructure and Orientation Effects in Ballistic Si and Ge Nanowire FETs IEEE Int. Electron Dev. Mtg Dec. 5-7, 2005, 537-540
    • (2005) IEEE Int. Electron Dev. Mtg , pp. 537-540
    • Wang, J.1    Rahman, A.2    Klimeck, G.3    Lundstrom, M.4
  • 23
    • 21044455361 scopus 로고    scopus 로고
    • Performance evaluation of ballistic silicon nanowire transistors with atomic-basis dispersion relations
    • DOI 10.1063/1.1873055, 093113
    • Wang, J.; Rahman, A.; Ghosh, A.; Klimeck, G.; Lundstrom, M. Performance Evaluation of Ballistic Silicon Nanowire Transistors with Atomic-basis Dispersion Relations Appl. Phys. Lett. 2005, 86 (9) 093113 10.1063/1.1873055 (Pubitemid 40870914)
    • (2005) Applied Physics Letters , vol.86 , Issue.9 , pp. 1-3
    • Wang, J.1    Rahman, A.2    Ghosh, A.3    Klimeck, G.4    Lundstrom, M.5
  • 25
    • 38949130708 scopus 로고    scopus 로고
    • Experimental evidence of ballistic transport in cylindrical gate-all-around twin silicon nanowire metal-oxide-semiconductor field-effect transistors
    • Cho, K. H. Experimental evidence of ballistic transport in cylindrical gate-all-around twin silicon nanowire metal-oxide-semiconductor field-effect transistors Appl. Phys. Lett. 2008, 92 (no. 5) 052102
    • (2008) Appl. Phys. Lett. , vol.92 , Issue.5 , pp. 052102
    • Cho, K.H.1
  • 27
    • 75749116799 scopus 로고    scopus 로고
    • OnLandauer versus Boltzmann and full band versus effective mass evaluation of thermoelectric transport coefficients
    • Jeong, C.; Kim, R.; Luisier, M.; Datta, S.; Lundstrom, M. OnLandauer versus Boltzmann and full band versus effective mass evaluation of thermoelectric transport coefficients J. Appl. Phys. 2010, 107 (no. 2) 023707
    • (2010) J. Appl. Phys. , vol.107 , Issue.2 , pp. 023707
    • Jeong, C.1    Kim, R.2    Luisier, M.3    Datta, S.4    Lundstrom, M.5
  • 29
    • 0028747841 scopus 로고
    • On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration
    • Takagi, S.; Toriumi, A.; Iwase, M.; Tango, H. On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration IEEE Trans. Electron. Devices 1994, 41 (no. 12) 2357-2362
    • (1994) IEEE Trans. Electron. Devices , vol.41 , Issue.12 , pp. 2357-2362
    • Takagi, S.1    Toriumi, A.2    Iwase, M.3    Tango, H.4
  • 30
    • 0028747841 scopus 로고
    • On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration
    • Takagi, S.; Toriumi, A.; Iwase, M.; Tango, H. On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration IEEE Trans. Electron. Devices 1994, 41 (no. 12) 2357-2362
    • (1994) IEEE Trans. Electron. Devices , vol.41 , Issue.12 , pp. 2357-2362
    • Takagi, S.1    Toriumi, A.2    Iwase, M.3    Tango, H.4
  • 31
    • 84893264597 scopus 로고    scopus 로고
    • Modeling of electron mobility in gated silicon nanowires at room temperature: Surface roughness scattering, dielectric screening, and band nonparabolicity
    • Jin, S.; Fischetti, M. V.; wei Tang, T. Modeling of electron mobility in gated silicon nanowires at room temperature: Surface roughness scattering, dielectric screening, and band nonparabolicity J. Appl. Phys. 2007, 102 (no. 8) 083715
    • (2007) J. Appl. Phys. , vol.102 , Issue.8 , pp. 083715
    • Jin, S.1    Fischetti, M.V.2    Wei Tang, T.3
  • 32
    • 0004200915 scopus 로고    scopus 로고
    • Prentice-Hall: Upper Saddle River, NJ
    • Razavi, B. RF Microelectronics; Prentice-Hall: Upper Saddle River, NJ, 1998.
    • (1998) RF Microelectronics
    • Razavi, B.1


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