Quantitative Kelvin probe force microscopy of current-carrying devices

Applied Physics Letters

Volumn 102, Issue 8, 2013, Pages

  Fuller, Elliot J ^a   Pan, Deng ^a   Corso, Brad L ^a   Tolga Gul, O ^a   Gomez, Jose R ^a   Collins, Philip G ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE GEOMETRIES; ELECTROSTATIC POTENTIALS; KELVIN PROBE FORCE MICROSCOPY; NANOSCALE ELECTRONICS; POTENTIAL MEASUREMENTS; POTENTIAL PROFILES; SEMICONDUCTING SWNTS; SINGLE-WALLED CARBON NANOTUBE (SWNTS);

SINGLE-WALLED CARBON NANOTUBES (SWCN);

PROBES;

EID: 84874873687     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4793480     Document Type: Article

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