Scanning gate spectroscopy and its application to carbon nanotube defects

Nano Letters

Volumn 11, Issue 3, 2011, Pages 1055-1060

  Hunt, Steven R ^a   Wan, Danny ^a   Khalap, Vaikunth R ^a   Corso, Brad L ^a   Collins, Philip G ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Carbon nanotube; defect; electronic spectroscopy; molecular electronics; scanning gate microscopy

Indexed keywords

CARBON NANOTUBE TRANSISTORS; CARRIER SCATTERING; DEFECT SITES; ELECTRONIC SPECTROSCOPY; ELECTROSTATIC POTENTIALS; ENERGY DEPENDENT; ENERGY SPECTRA; EXPERIMENTAL DATA; IMAGING MODES; MOLECULAR-SCALE DEVICES; SCANNING GATE MICROSCOPY; TRANSMISSION MODEL; TUNNEL BARRIER;

CARBON NANOTUBES; DEFECTS; ELECTROSTATIC DEVICES; ELECTROSTATICS; MOLECULAR ELECTRONICS; PHENOLS; SCANNING; SPECTROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

CARBON NANOTUBE;

ARTICLE; METHODOLOGY; MICROSCOPY; SPECTROSCOPY; STATIC ELECTRICITY;

MICROSCOPY; NANOTUBES, CARBON; SPECTRUM ANALYSIS; STATIC ELECTRICITY;

EID: 79952584215     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl103935r     Document Type: Article

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