Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry

Nanotechnology

Volumn 18, Issue 8, 2007, Pages

  Miyato, Yuji ^a   Kobayashi, Kei ^a   Matsushige, Kazumi ^a   Yamada, Hirofumi ^a,b  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; POTENTIOMETRIC SENSORS; SURFACE PROPERTIES; VOLTAGE MEASUREMENT;

ATOMIC FORCE MICROSCOPE POTENTIOMETRY; KELVIN PROBE FORCE MICROSCOPY; POINT-BY-POINT CONTACT MODE;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

SINGLE WALLED NANOTUBE;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; ELECTRIC FIELD; ELECTRIC POTENTIAL; INTERMETHOD COMPARISON; MEASUREMENT; MOLECULAR PROBE; POTENTIOMETRY; PRIORITY JOURNAL; SURFACE PROPERTY;

EID: 33947520753     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/8/084008     Document Type: Conference Paper

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