Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin force microscopy

Applied Physics Letters

Volumn 94, Issue 22, 2009, Pages

  Brunel, David ^a   Deresmes, Dominique ^a   Ḿlin, Thierry ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGING EFFECT; BACK-GATE; CARBON NANOTUBE FIELD EFFECT TRANSISTORS; ELECTROSTATIC PROPERTIES; KELVIN FORCE MICROSCOPY; LEVER ARM; ROOM TEMPERATURE; SINGLE-WALLED CARBON NANOTUBE FIELD EFFECT TRANSISTORS; TRANSPORT MEASUREMENTS;

CARBON NANOTUBES; ELECTRON MULTIPLIERS; ELECTROSTATIC DEVICES; ELECTROSTATICS; SINGLE-WALLED CARBON NANOTUBES (SWCN);

FIELD EFFECT TRANSISTORS;

EID: 66749159038     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3148364     Document Type: Article

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