Effect of trapped charges on local potential measurement of carbon nanotubes using frequency-modulation Kelvin-probe force microscopy

e-Journal of Surface Science and Nanotechnology

Volumn 9, Issue , 2011, Pages 210-214

  Ito, Masanao ^a   Hosokawa, Yoshihiro ^a   Nishi, Ryuji ^a   Miyato, Yuji ^a   Kobayashi, Kei ^a   Matsushige, Kazumi ^a   Yamaday, Hirofumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

And manipulation technology; Atomic force microscopy; Carbon nanotube; Kelvin probe force microscopy; Measurement; Nano scale imaging; Surface electronic phenomena; Trapped charge

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBE FIELD EFFECT TRANSISTORS; CARBON NANOTUBES; MEASUREMENT; PROBES; SILICON COMPOUNDS; SILICON OXIDES; SINGLE-WALLED CARBON NANOTUBES (SWCN); SURFACE DEFECTS; YARN;

KELVIN PROBE FORCE MICROSCOPY; MANIPULATION TECHNOLOGIES; NANO-SCALE IMAGING; SURFACE ELECTRONIC PHENOMENA; TRAPPED CHARGE;

FREQUENCY MODULATION;

EID: 79955907716     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2011.210     Document Type: Article

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