Quantitative thermal imaging of single-walled carbon nanotube devices by scanning Joule expansion microscopy

ACS Nano

Volumn 6, Issue 11, 2012, Pages 10267-10275

  Xie, Xu ^a   Grosse, Kyle L ^b   Song, Jizhou ^c   Lu, Chaofeng ^d   Dunham, Simon ^a   Du, Frank ^a   Islam, Ahmad E ^a   Li, Yuhang ^e   Zhang, Yihui ^e,f   Pop, Eric ^a   Huang, Yonggang ^e   King, William P ^c   Rogers, John A ^a,b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c University of Miami   (United States)

^d ZHEJIANG UNIVERSITY   (China)

^e Northwestern University   (United States)

^f TSINGHUA UNIVERSITY   (China)

Author keywords

chirality change; defect; heat generation; resolution; scanning Joule expansion microscopy; single walled carbon nanotube; temperature distribution; thermal expansion

Indexed keywords

APPLIED VOLTAGES; DEVICE STRUCTURES; ELECTRICAL GENERATION; ELECTRONIC BEHAVIORS; HORIZONTAL ARRAYS; LOCALIZED DEFECTS; QUANTITATIVE ASSESSMENTS; QUANTITATIVE EXTRACTION; SINGLE-WALLED CARBON; SPATIAL RESOLUTION; SPATIAL VARIATIONS; THERMAL TRANSPORT; TRANSISTOR STRUCTURE; TRANSPORT CHARACTERISTICS;

CHIRALITY; DEFECTS; ENANTIOMERS; EXPANSION; HEAT GENERATION; INFRARED IMAGING; OPTICAL RESOLVING POWER; SINGLE-WALLED CARBON NANOTUBES (SWCN); TEMPERATURE DISTRIBUTION; THERMAL EXPANSION;

SCANNING;

CARBON NANOTUBE;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; MATERIALS TESTING; METHODOLOGY; SCANNING PROBE MICROSCOPY; THERMOGRAPHY;

COMPUTER SIMULATION; MATERIALS TESTING; MICROSCOPY, SCANNING PROBE; MODELS, CHEMICAL; NANOTUBES, CARBON; THERMOGRAPHY;

EID: 84870446462     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn304083a     Document Type: Article

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