Heat bump on a monochromator crystal measured with X-ray grating interferometry

Journal of Synchrotron Radiation

Volumn 20, Issue 2, 2013, Pages 300-305

  Rutishauser, Simon ^a   Rack, Alexander ^b   Weitkamp, Timm ^c   Kayser, Yves ^a   David, Christian ^a   MacRander, Albert T ^d  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c SYNCHROTRON SOLEIL   (France)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Double crystal monochromator; Grating interferometry; Heat bump; Wavefront characterization

Indexed keywords

ANGULAR SENSITIVITY; CRYSTAL DEFORMATION; DOUBLE-CRYSTAL MONOCHROMATORS; GRATING INTERFEROMETRY; HARD X RAY; HEAT BUMP; HIGH-POWER BEAMS; MONOCHROMATOR CRYSTALS; PHOTON ENERGY; QUANTITATIVE MEASUREMENT; SILICON (111); SLOPE ERRORS; SYNCHROTRON BEAMLINES; X-RAY GRATINGS; X-RAY MONOCHROMATOR;

DEFORMATION; INTERFEROMETRY; WAVEFRONTS; X RAYS;

MONOCHROMATORS;

EID: 84874096908     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049513001817     Document Type: Article

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