X-ray wavefront characterization using a rotating shearing interferometer technique

Optics Express

Volumn 19, Issue 17, 2011, Pages 16550-16559

  Wang, Hongchang ^a   Sawhney, Kawal ^a   Berujon, Sébastien ^a,b   Ziegler, Eric ^b   Rutishauser, Simon ^c   David, Christian ^c  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; LIGHT SOURCES; OPTICS; ROTATION; SHEARING; WAVEFRONTS;

BEAM LINES; DIAMOND LIGHT SOURCE; FRINGE ANALYSIS; GRATING PROJECTION; IMPROVED METHODS; MATHEMATICAL RELATION; PHASE GRATING; PRIORI KNOWLEDGE; RADII OF CURVATURE; SHEARING INTERFEROMETER; STEP-BY-STEP; WAVE-FRONT RADII; WAVEFRONT DISTORTION; X RAY BEAM; X-RAY REFLECTIVE; X-RAY SHEARING INTERFEROMETER; X-RAY WAVEFRONTS;

X RAYS;

EID: 80051715796     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.016550     Document Type: Article

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