SCOPUS 정보 검색 플랫폼

Volumn 1466, Issue , 2012, Pages 23-28

X-ray grating interferometry - Applications in metrology and wave front sensing

b DESY (Germany)

Author keywords

free electron lasers; metrology; moir ; wave front; x ray optics

Indexed keywords

EID: 84873249081 PISSN: 0094243X EISSN: 15517616 Source Type: Conference Proceeding
DOI: 10.1063/1.4742264 Document Type: Conference Paper

Times cited : (4)

References (13)

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