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Volumn 105, Issue 24, 2010, Pages

Two-dimensional X-ray grating interferometer

Author keywords

[No Author keywords available]

Indexed keywords

DARK-FIELD; MULTI-DIRECTIONAL; PHASE IMAGE; X-RAY GRATING INTERFEROMETERS;

INTERFEROMETERS;

EID: 78649806074 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.105.248102 Document Type: Article

Times cited : (125)

References (17)

1
- 79957992651
- APPLAB 0003-6951 10.1063/1.1516611
- C. David, B. Nöhammer, H.H. Solak, and E. Ziegler, Appl. Phys. Lett. 81, 3287 (2002). APPLAB 0003-6951 10.1063/1.1516611
- (2002) Appl. Phys. Lett. , vol.81 , pp. 3287
- David, C.¹ Nöhammer, B.² Solak, H.H.³ Ziegler, E.⁴

2
- 0141606690
- JAPNDE 0021-4922 10.1143/JJAP.42.L866
- A. Momose, Jpn. J. Appl. Phys. JAPNDE 0021-4922 42, L866 (2003). 10.1143/JJAP.42.L866
- (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 866
- Momose, A.¹

3
- 18644362806
- APPLAB 0003-6951 10.1063/1.1857066
- T. Weitkamp, B. Nöhammer, A. Diaz, C. David, and E. Ziegler, Appl. Phys. Lett. 86, 054101 (2005); APPLAB 0003-6951 10.1063/1.1857066
- (2005) Appl. Phys. Lett. , vol.86 , pp. 054101
- Weitkamp, T.¹ Nöhammer, B.² Diaz, A.³ David, C.⁴ Ziegler, E.⁵

5
- 24044538888
- OPEXFF 1094-4087 10.1364/OPEX.13.006296
- T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, and E. Ziegler, Opt. Express 13, 6296 (2005). OPEXFF 1094-4087 10.1364/OPEX.13.006296
- (2005) Opt. Express , vol.13 , pp. 6296
- Weitkamp, T.¹ Diaz, A.² David, C.³ Pfeiffer, F.⁴ Stampanoni, M.⁵ Cloetens, P.⁶ Ziegler, E.⁷

6
- 38549083797
- NMAACR 1476-1122 10.1038/nmat2096
- F. Pfeiffer, M. Bech, O. Bunk, P. Kraft, E.F. Eikenberry, C. Brönnimann, C. Grünzweig, and C. David, Nature Mater. NMAACR 1476-1122 7, 134 (2008). 10.1038/nmat2096
- (2008) Nature Mater. , vol.7 , pp. 134
- Pfeiffer, F.¹ Bech, M.² Bunk, O.³ Kraft, P.⁴ Eikenberry, E.F.⁵ Brönnimann, C.⁶ Grünzweig, C.⁷ David, C.⁸

7
- 34247602602
- MIENEF 0167-9317 10.1016/j.mee.2007.01.151
- C. David, J. Bruder, T. Rohbeck, C. Grünzweig, C. Kottler, A. Diaz, O. Bunk, and F. Pfeiffer, Microelectron. Eng. 84, 1172 (2007). MIENEF 0167-9317 10.1016/j.mee.2007.01.151
- (2007) Microelectron. Eng. , vol.84 , pp. 1172
- David, C.¹ Bruder, J.² Rohbeck, T.³ Grünzweig, C.⁴ Kottler, C.⁵ Diaz, A.⁶ Bunk, O.⁷ Pfeiffer, F.⁸

8
- 49949111063
- 0946-7076 10.1007/s00542-007-0507-x
- E. Reznikova, J. Mohr, M. Börner, V. Nazmov, and P.J. Jakobs, Microsyst. Technol. 0946-7076 14, 1683 (2008). 10.1007/s00542-007-0507-x
- (2008) Microsyst. Technol. , vol.14 , pp. 1683
- Reznikova, E.¹ Mohr, J.² Börner, M.³ Nazmov, V.⁴ Jakobs, P.J.⁵

9
- 78049354000
- OPEGAR 0091-3286 10.1117/1.3205036
- K.L. Baker, Opt. Eng. (Bellingham, Wash.) OPEGAR 0091-3286 48, 086501 (2009), and references therein. 10.1117/1.3205036
- (2009) Opt. Eng. (Bellingham, Wash.) , vol.48 , pp. 086501
- Baker, K.L.¹

10
- 77954912190
- OPLEDP 0146-9592 10.1364/OL.35.001932
- H.H. Wen, E.E. Bennett, R. Kopace, A.F. Stein, and V. Pai, Opt. Lett. 35, 1932 (2010). OPLEDP 0146-9592 10.1364/OL.35.001932
- (2010) Opt. Lett. , vol.35 , pp. 1932
- Wen, H.H.¹ Bennett, E.E.² Kopace, R.³ Stein, A.F.⁴ Pai, V.⁵

11
- 31544464084
- JAPNDE 0021-4922 10.1143/JJAP.45.314
- A. Momose and S. Kawamoto, Jpn. J. Appl. Phys. JAPNDE 0021-4922 45, 314 (2006). 10.1143/JJAP.45.314
- (2006) Jpn. J. Appl. Phys. , vol.45 , pp. 314
- Momose, A.¹ Kawamoto, S.²

12
- 59349114117
- APPLAB 0003-6951 10.1063/1.3078410
- A. Olivo, S.E. Bohndiek, J.A. Griffiths, A. Konstantinidis, and R.D. Speller, Appl. Phys. Lett. 94, 044108 (2009). APPLAB 0003-6951 10.1063/1.3078410
- (2009) Appl. Phys. Lett. , vol.94 , pp. 044108
- Olivo, A.¹ Bohndiek, S.E.² Griffiths, J.A.³ Konstantinidis, A.⁴ Speller, R.D.⁵

13
- 77957985834
- APCPCS 0094-243X 10.1063/1.3399260
- I. Zanette, C. David, S. Rutishauser, and T. Weitkamp, AIP Conf. Proc. APCPCS 0094-243X 1221, 73 (2010). 10.1063/1.3399260
- (2010) AIP Conf. Proc. , vol.1221 , pp. 73
- Zanette, I.¹ David, C.² Rutishauser, S.³ Weitkamp, T.⁴

14
- 70349315433
- JAPIAU 0021-8979 10.1063/1.3208052
- T. Donath, M. Chabior, F. Pfeiffer, O. Bunk, E. Reznikova, J. Mohr, E. Hempel, S. Popescu, M. Hoheisel, M. Schuster, J. Baumann, and C. David, J. Appl. Phys. 106, 054703 (2009). JAPIAU 0021-8979 10.1063/1.3208052
- (2009) J. Appl. Phys. , vol.106 , pp. 054703
- Donath, T.¹ Chabior, M.² Pfeiffer, F.³ Bunk, O.⁴ Reznikova, E.⁵ Mohr, J.⁶ Hempel, E.⁷ Popescu, S.⁸ Hoheisel, M.⁹ Schuster, M.¹⁰ Baumann, J.¹¹ David, C.¹²

15
- 78649434194
- PSISDG 0277-786X 10.1117/12.860203
- T. Weitkamp, I. Zanette, C. David, J. Baruchel, M. Bech, P. Bernard, H. Deyhle, T. Donath, J. Kenntner, S. Lang, J. Mohr, B. Müller, F. Pfeiffer, E. Reznikova, S. Rutishauser, G. Schulz, A. Tapfer, and J.P. Valade, Proc. SPIE Int. Soc. Opt. Eng. PSISDG 0277-786X 7804, 780406 (2010). 10.1117/12.860203
- (2010) Proc. SPIE Int. Soc. Opt. Eng. , vol.7804 , pp. 780406
- Weitkamp, T.¹ Zanette, I.² David, C.³ Baruchel, J.⁴ Bech, M.⁵ Bernard, P.⁶ Deyhle, H.⁷ Donath, T.⁸ Kenntner, J.⁹ Lang, S.¹⁰ Mohr, J.¹¹ Müller, B.¹² Pfeiffer, F.¹³ Reznikova, E.¹⁴ Rutishauser, S.¹⁵ Schulz, G.¹⁶ Tapfer, A.¹⁷ Valade, J.P.¹⁸

16
- 0024048847
- ITPIDJ 0162-8828 10.1109/34.3909
- R. Frankot and R. Chellappa, IEEE Trans. Pattern Anal. Mach. Intell. 10, 439 (1988). ITPIDJ 0162-8828 10.1109/34.3909
- (1988) IEEE Trans. Pattern Anal. Mach. Intell. , vol.10 , pp. 439
- Frankot, R.¹ Chellappa, R.²

17
- 17944362788
- APPLAB 0003-6951 10.1063/1.1882745
- T. Weitkamp, B. Nöhammer, A. Diaz, C. David, and E. Ziegler, Appl. Phys. Lett. 86, 119902 (2005). APPLAB 0003-6951 10.1063/1.1882745
- (2005) Appl. Phys. Lett. , vol.86 , pp. 119902
- Weitkamp, T.¹ Nöhammer, B.² Diaz, A.³ David, C.⁴ Ziegler, E.⁵

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