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Volumn 16, Issue 4, 2009, Pages 562-572

Advanced phase-contrast imaging using a grating interferometer

Author keywords

Darkfield; Differential phase contrast; Grating interferometry; Synchrotron microtomography; X ray imaging

Indexed keywords

DARKFIELD; DIFFERENTIAL PHASE CONTRAST; GRATING INTERFEROMETRY; SYNCHROTRON MICROTOMOGRAPHY; X-RAY IMAGING;

EID: 67651180649     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049509017920     Document Type: Article
Times cited : (109)

References (36)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.