Performance of a cryogenic silicon monochromator under extreme heat load

Journal of Synchrotron Radiation

Volumn 11, Issue 2, 2004, Pages 132-141

  Chumakov, Aleksandr ^a,c   Rüffer, Rudolf ^a   Leupold, Olaf ^a   Celse, Jean Philippe ^a   Martel, Keith ^a   Rossat, Michel ^a   Lee, Wah Keat ^a,b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

Cryogenic cooling; High heat load optics; Silicon monochromators; X ray optics

Indexed keywords

COOLING; CRYOGENIC EQUIPMENT; CRYSTAL DEFECTS; HEAT FLUX; SILICON; SYNCHROTRON RADIATION; THERMAL EFFECTS; X RAY OPTICS;

CRYOGENIC COOLING; CRYSTAL DISTORTION; HIGH HEAT LOAD OPTICS; SILICON MONOCHROMATORS;

MONOCHROMATORS;

SILICON;

ARTICLE; EQUIPMENT; EVALUATION; FREEZING; HEAT; INSTRUMENTATION; SYNCHROTRON; TRANSDUCER; X RAY;

EQUIPMENT FAILURE ANALYSIS; FREEZING; HEAT; SILICON; SYNCHROTRONS; TRANSDUCERS; X-RAYS;

EID: 3843118034     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049503026785     Document Type: Article

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