Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

Optics Express

Volumn 20, Issue 22, 2012, Pages 24977-24986

  Matsuyama, Satoshi ^a   Yokoyama, Hikaru ^a   Fukui, Ryosuke ^a   Kohmura, Yoshiki ^b   Tamasaku, Kenji ^b   Yabashi, Makina ^b   Yashiro, Wataru ^c   Momose, Atsushi ^c   Ishikawa, Tetsuya ^b   Yamauchi, Kazuto ^a,d  

^a OSAKA UNIVERSITY   (Japan)

^b RIKEN   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM LINES; BEAM WAIST; DEFORMABLE MIRRORS; DISTORTED WAVEFRONT; ELLIPTICAL MIRRORS; FOCUSING MIRRORS; FOURIER TRANSFORM METHOD; INTENSITY PROFILES; PHASE RETRIEVAL; SPRING-8; TALBOT EFFECTS; WAVEFRONT ERRORS; WAVEFRONT MEASUREMENT;

INTERFEROMETRY; NANOWIRES; X RAYS;

WAVEFRONTS;

EID: 84868238302     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.024977     Document Type: Article

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