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Volumn 17, Issue 3, 2010, Pages 299-307

Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry

Author keywords

Coherence; Interferometry; Wavefront characterization; X rays

Indexed keywords

COHERENCE; COHERENCE INTERFEROMETRY; COHERENT DIFFRACTION IMAGING; COMPLEX COHERENCE FACTORS; DOUBLE-CRYSTAL MONOCHROMATORS; GRATING INTERFEROMETERS; GRATING INTERFEROMETRY; HARD X RAY; OPTICAL ELEMENTS; SAMPLE POSITION; SYNCHROTRON SOURCE; TRANSVERSE COHERENCE; VERTICAL DIRECTION; WAVEFRONT DISTORTION; WAVEFRONT PROPERTIES;

EID: 77951476050     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049510004644     Document Type: Article
Times cited : (44)

References (32)
  • 10
    • 0042045277 scopus 로고    scopus 로고
    • New York: Addison-Wesley
    • Hecht, E. (2002). Optics. New York: Addison-Wesley.
    • (2002) Optics
    • Hecht, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.