X-ray wavefront analysis and optics characterization with a grating interferometer

Applied Physics Letters

Volumn 86, Issue 5, 2005, Pages 1-3

  Weitkamp, Timm ^a,b   Nöhammer, Bernd ^a,b   Diaz, Ana ^a,b   David, Christian ^a,b   Ziegler, Eric ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; OPTICAL BEAM SPLITTERS; OPTICAL RESOLVING POWER; OPTICS; WAVEFRONTS; X RAYS;

GRATING INTERFEROMETERS; OPTICS CHARACTERIZATION; WAVEFRONT ANALYSIS; X-RAY WAVEFRONTS;

INTERFEROMETERS;

EID: 18644362806     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1857066     Document Type: Article

References (11)

1. R. Fitzgerald, Phys. Today 53, 23 (2000).
2. J. Miao, P. Charalambous, J. Kirz, and D. Sayre, Nature (London) 400, 342 (1999).
3. I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, Phys. Rev. Lett. 87, 195505 (2001).
4. P. Naulleau, K. A. Goldberg, E. H. Anderson, P. Batson, P. E. Denham, K. H. Jackson, E. M. Gullikson, S. Rekawa, and J. Bokor, J. Vac. Sci. Technol. B 19, 2396 (2001).
5. P. Cloetens, W. Ludwig, J. Baruchel, D. V. Dyck, J. V. Landuyt, J. P. Guigay, and M. Schlenker, Appl. Phys. Lett. 75, 2912 (1999).
6. U. Bonse and M. Hart, Appl. Phys. Lett. 6, 155 (1965).
7. A. Momose, Opt. Express 11, 2303 (2003).
8. C. David, B. Nöhammer, H. H. Solak, and E. Ziegler, Appl. Phys. Lett. 81, 3287 (2002).
9. C. David, E. Ziegler, and B. Nöhammer, J. Synchrotron Radiat. 8, 1054 (2001).
10. T. Weitkamp, A. Diaz, B. Nöhammer, F. Pfeiffer, M. Stampanoni, E. Ziegler, and C. David, Proc. SPIE 5533, 140 (2004).
11. L. Assoufid, O. Hignette, M. Howells, S. Irick, H. Lammert, and P. Takacs, Nucl. Instrum. Methods Phys. Res. A 467, 267 (2001).