Recent developments in X-ray Talbot interferometry at ESRF-ID19

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7804, Issue , 2010, Pages

  Weitkamp, Timm ^a,b   Zanette, Irene ^a   David, Christian ^c   Baruchel, José ^a   Bech, Martin ^d   Bernard, Pascal ^a   Deyhle, Hans ^e   Donath, Tilman ^c   Kenntner, Johannes ^f   Lang, Sabrina ^e   Mohr, Jürgen ^f   Müller, Bert ^e   Pfeiffer, Franz ^d   Reznikova, Elena ^f   Rutishauser, Simon ^c   Schulz, Georg ^e   Tapfer, Arne ^d   Valade, Jean Paul ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b SYNCHROTRON SOLEIL   (France)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^e UNIVERSITY OF BASEL   (Switzerland)

^f KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

coherence; microtomography; phase retrieval; phase stepping interferometry; synchrotron radiation; Talbot interferometry; X ray phase contrast; X ray tomography

Indexed keywords

COHERENCE; MICRO-TOMOGRAPHY; PHASE RETRIEVAL; PHASE-STEPPING INTERFEROMETRY; TALBOT INTERFEROMETRY; X RAY PHASE CONTRAST; X-RAY TOMOGRAPHY;

IMAGING SYSTEMS; INTERFEROMETRY; SYNCHROTRON RADIATION; SYNCHROTRONS; TOMOGRAPHY;

X RAYS;

EID: 78649434194     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.860203     Document Type: Conference Paper

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