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Applied Physics Letters

Volumn 99, Issue 22, 2011, Pages

At-wavelength characterization of refractive x-ray lenses using a two-dimensional grating interferometer

(5) Rutishauser, Simon a Zanette, Irene b Weitkamp, Timm c Donath, Tilman a,d David, Christian a

a PAUL SCHERRER INSTITUTE (Switzerland)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c SYNCHROTRON SOLEIL (France)

d DECTRIS LTD (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AT-WAVELENGTH CHARACTERIZATION; FOCUSING LENS; HARD X RAY; LENS SHAPE; RADIUS OF CURVATURE; REFRACTION ANGLES; REFRACTIVE X-RAY LENS; RESIDUAL ABERRATION; TWO-DIMENSIONAL GRATING;

BERYLLIUM; COMPUTERIZED TOMOGRAPHY; TWO DIMENSIONAL; X RAYS;

INTERFEROMETERS;

EID: 82955201616 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3665063 Document Type: Article

Times cited : (48)

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