Submicrometre-resolution polychromatic three-dimensional X-ray microscopy

Journal of Applied Crystallography

Volumn 46, Issue 1, 2013, Pages 153-164

  Larson, B C ^a   Levine, L E ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

diffraction imaging; structural characterization; three dimensional X ray microscopy

Indexed keywords

CRYSTALLOGRAPHIC PHASE; DIFFRACTION IMAGING; DIFFRACTION TECHNIQUES; DIRECT DETERMINATION; ELASTIC STRAIN TENSOR; GRAIN INTERFACE; GRAIN MORPHOLOGIES; INCIDENT BEAMS; INDENTATION DEFORMATION; INTERFACE STRENGTH; METAL MATRIX COMPOSITES; NANOPLATELET; NON DESTRUCTIVE; POLYCRYSTALLINE ALUMINIUM; POLYCRYSTALLINE METALS; SN WHISKER; SPATIAL RESOLUTION; STRUCTURAL CHARACTERIZATION; THERMAL GRAIN GROWTH; THREE DIMENSIONS; X RAY MICROSCOPY;

DEFORMATION; DIFFRACTION; GRAIN GROWTH; IMAGE RESOLUTION; METALLIC MATRIX COMPOSITES; SEMICONDUCTOR GROWTH; SEMICONDUCTOR INSULATOR BOUNDARIES; TENSORS; TIN; VANADIUM COMPOUNDS; X RAY MICROSCOPES; X RAYS;

THREE DIMENSIONAL;

EID: 84872713143     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812043737     Document Type: Article

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