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Volumn 29, Issue 3, 2004, Pages

Three-Dimensional X-Ray Diffraction Microscopy Using High-Energy X-Rays

Author keywords

Grain dynamics; Grain mapping; High energy x rays; Three dimensional x ray diffraction microscopy

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLIZATION; GRAIN SIZE AND SHAPE; NONDESTRUCTIVE EXAMINATION; PLASTIC DEFORMATION; POLYCRYSTALS; X RAY DIFFRACTION ANALYSIS;

EID: 1642634994     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2004.54     Document Type: Article
Times cited : (31)

References (23)
  • 22
    • 0002844612 scopus 로고    scopus 로고
    • edited by N. Hansen, X. Huang, D. Juul Jensen, E.M. Lauridsen, T. Leffers, W. Pantleon, T.J. Sabin, and J.A. Wert. (Risø National Laboratory, Roskilde, Denmark)
    • S.F. Nielsen, W. Ludwig, D. Bellet, E.M. Lauridsen, H.F. Poulsen, and D. Juul Jensen, in Proc. 21st Risø Int. Symp. on Materials Science, edited by N. Hansen, X. Huang, D. Juul Jensen, E.M. Lauridsen, T. Leffers, W. Pantleon, T.J. Sabin, and J.A. Wert. (Risø National Laboratory, Roskilde, Denmark, 2000) p. 473.
    • (2000) Proc. 21st Risø Int. Symp. on Materials Science , pp. 473
    • Nielsen, S.F.1    Ludwig, W.2    Bellet, D.3    Lauridsen, E.M.4    Poulsen, H.F.5    Jensen, D.J.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.