Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors

Journal of Applied Crystallography

Volumn 45, Issue 2, 2012, Pages 157-165

  Levine, Lyle E ^a   Geantil, Peter ^b   Larson, Bennett C ^c   Tischler, Jonathan Z ^c   Kassner, Michael E ^b   Liu, Wenjun ^d  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Southern California   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

dislocation structures; line profile analysis; metal deformation

Indexed keywords

COMPLEX MODEL; DEFORMED METALS; DEPTH-RESOLVED; DIFFRACTION LINES; DISLOCATION CELL WALL; DISLOCATION STRUCTURES; HEAVILY DEFORMED; LINE BROADENING; LINE PROFILE ANALYSIS; LINE PROFILES; METAL DEFORMATION; MICROBEAM DIFFRACTION; X RAY MEASUREMENTS;

CYTOLOGY; DIFFRACTION;

CELLS;

EID: 84859769666     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812001616     Document Type: Article

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