-
1
-
-
70249149399
-
Formation of optical images by X-rays
-
P. Kirkpatrick, and V. Baez Formation of optical images by X-rays J. Opt. Soc. Am. 38 9 1948 766 774
-
(1948)
J. Opt. Soc. Am.
, vol.38
, Issue.9
, pp. 766-774
-
-
Kirkpatrick, P.1
Baez, V.2
-
2
-
-
85077798631
-
New schemes for producing high-accuracy elliptical X-ray mirrors by elastic bending
-
H.A. Padmore, M.R. Howells, S.C. Irick, T. Renner, R. Sandler, and Y.M. Koo New schemes for producing high-accuracy elliptical X-ray mirrors by elastic bending Proc. SPIE 2856 1996 145 156
-
(1996)
Proc. SPIE
, vol.2856
, pp. 145-156
-
-
Padmore, H.A.1
Howells, M.R.2
Irick, S.C.3
Renner, T.4
Sandler, R.5
Koo, Y.M.6
-
5
-
-
84855267065
-
-
Tinsley Laboratories Inc., 4040 Lakeside Dr. Richmond, CA 94806 USA
-
Computer Controlled Optical Surfacing, Tinsley Laboratories Inc., 4040 Lakeside Dr. Richmond, CA 94806 USA, www.asphere.com.
-
Computer Controlled Optical Surfacing
-
-
-
6
-
-
0142167372
-
Fabrication of elliptical mirror at nanometer-level accuracy for hard X-ray focusing by numerically controlled plasma chemical vaporization machining
-
K. Yamamura Fabrication of elliptical mirror at nanometer-level accuracy for hard X-ray focusing by numerically controlled plasma chemical vaporization machining Rev. Sci. Instrum. 74 2003 4549 4553
-
(2003)
Rev. Sci. Instrum.
, vol.74
, pp. 4549-4553
-
-
Yamamura, K.1
-
7
-
-
0037965484
-
Profile coating of KB mirrors at the advanced photon source
-
C. Liu, L. Assoufid, A.T. Macrander, G.E. Ice, and J.Z. Tischler Profile coating of KB mirrors at the advanced photon source SPIE 4782 2002 104 112
-
(2002)
SPIE
, vol.4782
, pp. 104-112
-
-
Liu, C.1
Assoufid, L.2
MacRander, A.T.3
Ice, G.E.4
Tischler, J.Z.5
-
8
-
-
85012249443
-
From flat substrate to elliptical KB mirror by profile coating
-
C. Liu, R. Conley, L. Assoufid, Z. Cai, J. Qian, and A.T. Macrander From flat substrate to elliptical KB mirror by profile coating AIP Conf. Proc. 705 2004 704 707
-
(2004)
AIP Conf. Proc.
, vol.705
, pp. 704-707
-
-
Liu, C.1
Conley, R.2
Assoufid, L.3
Cai, Z.4
Qian, J.5
MacRander, A.T.6
-
9
-
-
28444448758
-
Short focal length Kirkpatrick-Baez mirrors for a hard X-ray nanoprobe
-
W. Liu, G.E. Ice, J.Z. Tischler, A. Khounsary, C. Liu, L. Assoufid, and A.T. Macrander Short focal length Kirkpatrick-Baez mirrors for a hard X-ray nanoprobe Rev. Sci. Instrum. 76 2005 113701
-
(2005)
Rev. Sci. Instrum.
, vol.76
, pp. 113701
-
-
Liu, W.1
Ice, G.E.2
Tischler, J.Z.3
Khounsary, A.4
Liu, C.5
Assoufid, L.6
MacRander, A.T.7
-
10
-
-
0032607246
-
Design and performance of graded multilayers as focusing elements for X-ray optics
-
C. Morawe, P. Pecci, J.C. Peffern, and E. Ziegler Design and performance of graded multilayers as focusing elements for X-ray optics Rev. Sci. Instrum. 70 1999 3227 3232 (Pubitemid 129310400)
-
(1999)
Review of Scientific Instruments
, vol.70
, Issue.8
, pp. 3227-3232
-
-
Morawe, Ch.1
Pecci, P.2
Peffen, J.Ch.3
Ziegler, E.4
-
11
-
-
76449087110
-
Breaking the 10 nm barrier in hard-X-ray focusing
-
H. Mimura, S. Handa, T. Kimura, H. Yumoto, D. Yamakawa, H. Yokoyama, S. Matsuyama, K. Inagaki, K. Yamamura, S. Yasuhisa, K. Tamasaku, Y. Nishino, Y. Yabashi, T. Ishikawa, and K. Yamauchi Breaking the 10 nm barrier in hard-X-ray focusing Nat. Phys. 6 2 2010 57 60
-
(2010)
Nat. Phys.
, vol.6
, Issue.2
, pp. 57-60
-
-
Mimura, H.1
Handa, S.2
Kimura, T.3
Yumoto, H.4
Yamakawa, D.5
Yokoyama, H.6
Matsuyama, S.7
Inagaki, K.8
Yamamura, K.9
Yasuhisa, S.10
Tamasaku, K.11
Nishino, Y.12
Yabashi, Y.13
Ishikawa, T.14
Yamauchi, K.15
-
12
-
-
69249136594
-
At the limit of polychromatic microdiffraction
-
G. Ice At the limit of polychromatic microdiffraction Mater. Sci. Eng.: A 524 2009 3 9
-
(2009)
Mater. Sci. Eng.: A
, vol.524
, pp. 3-9
-
-
Ice, G.1
-
15
-
-
84855260406
-
-
Incoatec
-
Incoatec, Montel optics, (http://www.incoatec.de/products/montel-optics).
-
Montel Optics
-
-
-
16
-
-
41449086269
-
Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films
-
DOI 10.1557/jmr.2008.0077
-
D.J. Quinn, B. Wardle, and S.M. Spearing Residual stress and microstructure of as-deposited and annealed, sputtered yttria-stabilized zirconia thin films J. Mater. Res. 23 2008 609 618 (Pubitemid 351454252)
-
(2008)
Journal of Materials Research
, vol.23
, Issue.3
, pp. 609-618
-
-
Quinn, D.J.1
Wardle, B.2
Spearing, S.M.3
-
17
-
-
84855267066
-
-
unpublished
-
C. Liu, R. Conley, J. Qian, C.M. Kewish, W. Liu, L. Assoufid, A.T. Macrander, G.E. Ice, J. Z. Tischler, Recent developments in profile-coated elliptical KB mirrors, conference paper, (2008), unpublished.
-
(2008)
Recent Developments in Profile-coated Elliptical KB Mirrors, Conference Paper
-
-
Liu, C.1
Conley, R.2
Qian, J.3
Kewish, C.M.4
Liu, W.5
Assoufid, L.6
MacRander, A.T.7
Ice, G.E.8
Tischler, J.Z.9
-
18
-
-
84855267067
-
-
ADE Phase Shift Inc., 3470 East Universal Way, Tucson, AZ. 85706, a subsidiary of KLA-Tencor Corp.
-
ADE Phase Shift Inc., 3470 East Universal Way, Tucson, AZ. 85706, a subsidiary of KLA-Tencor Corp., www.KLA-Tencor.com.
-
-
-
-
19
-
-
84855267068
-
-
Dektak 8 programmable surface profiler, manufactured by Veeco Metrology LLC, 112 Robin Hill Road, Santa Barbara, CA 93117, USA
-
Dektak 8 programmable surface profiler, manufactured by Veeco Metrology LLC, 112 Robin Hill Road, Santa Barbara, CA 93117, USA.
-
-
-
-
21
-
-
26444518782
-
Diffraction-limited two-dimensional hard-X-ray focusing at the 100 nm level using kirkpatrick-baez mirror arrangement
-
083114
-
S. Matsuyama Diffraction-limited two-dimensional hard-X-ray focusing at the 100 nm level using kirkpatrick-baez mirror arrangement Rev. Sci. Instrum. 76 8 2005 083114
-
(2005)
Rev. Sci. Instrum.
, vol.76
, Issue.8
-
-
Matsuyama, S.1
|