Identifying and counting point defects in carbon nanotubes.

Nature materials

Volumn 4, Issue 12, 2005, Pages 906-911

  Fan, Yuwei ^a   Goldsmith, Brett R ^a   Collins, Philip G ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE; GOLD; TITANIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY;

ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; GOLD; MATERIALS TESTING; MICROELECTRODES; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; NANOTUBES, CARBON; TITANIUM;

EID: 33644675162     PISSN: 14761122     EISSN: None     Source Type: Journal    
DOI: 10.1038/nmat1516     Document Type: Article

References (0)