Is AlN/Sapphire bilayer structure an alternative to langasite for ultra-high-temperature SAW applications?

IEEE International Ultrasonics Symposium, IUS

Volumn , Issue , 2011, Pages 2082-2085

  Aubert, Thierry ^a   Elmazria, Omar ^a   Bardong, Jochen ^b   Bruckner, Gudrun ^b   Assouar, Badreddine ^c  

^a INSTITUT JEAN LAMOUR   (France)

^b CTR CARINTHIAN TECH RESEARCH AG   (Austria)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALN; BI-LAYER STRUCTURE; EXTREME TEMPERATURES; HIGH TEMPERATURE; IN-VACUUM; LANGASITES; ROOM TEMPERATURE; SENSITIVITY TO TEMPERATURES; SENSOR APPLICATIONS; ULTRAHIGH TEMPERATURE;

ACOUSTICS; ULTRASONICS;

IRIDIUM;

EID: 84869017384     PISSN: 19485719     EISSN: 19485727     Source Type: Conference Proceeding    
DOI: 10.1109/ULTSYM.2011.0516     Document Type: Conference Paper

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