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Volumn , Issue , 2009, Pages 28-32
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Characterisation setup of SAW devices at high temperatures and ultra high frequencies
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Author keywords
[No Author keywords available]
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Indexed keywords
CERAMIC CHIPS;
CHARACTERISATION;
CHIP CARRIER;
FEED THROUGH;
HIGH TEMPERATURE;
IN-SITU MEASUREMENT;
LANGASITES;
MEASUREMENT SETUP;
METAL GROUND PLATE;
METALLIC SPRINGS;
QUARTZ GLASS;
SAW DEVICE;
SIMULTANEOUS OPERATION;
STABLE MEASUREMENTS;
TEST DEVICE;
TEST UNIT;
ULTRA-HIGH FREQUENCY;
COAXIAL CABLES;
ELECTRIC CABLES;
INERT GASES;
OXIDE MINERALS;
PLATE METAL;
QUARTZ;
TELECOMMUNICATION CABLES;
VACUUM;
VACUUM APPLICATIONS;
ACOUSTIC SURFACE WAVE DEVICES;
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EID: 70449497976
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/FREQ.2009.5168136 Document Type: Conference Paper |
Times cited : (17)
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References (5)
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