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Volumn 81, Issue 12, 2010, Pages

Wavefield characterization of nearly diffraction-limited focused hard x-ray beam with size less than 10 nm

(14) Kimura, Takashi a Mimura, Hidekazu a Handa, Soichiro a Yumoto, Hirokatsu b Yokoyama, Hikaru a Imai, Shota a Matsuyama, Satoshi a Sano, Yasuhisa a Tamasaku, Kenji c Komura, Yoshiki c Nishino, Yoshinori d Yabashi, Makina b Ishikawa, Tetsuya b,c Yamauchi, Kazuto a

a OSAKA UNIVERSITY (Japan)

b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

c RIKEN SPring 8 Center (Japan)

d HOKKAIDO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APERTURE SIZES; BEAM-WAIST; DIFFRACTION LIMITED; FOCUSED BEAMS; HARD X-RAY BEAMS; IN-SITU; INTENSITY PROFILES; MULTI-LAYER MIRRORS; MULTIPLE INTENSITIES; PHASE PROFILE; PHASE RETRIEVAL; WAVEFIELDS; WAVEFRONT COMPENSATION; X RAY BEAM;

MIRRORS;

WAVEFRONTS;

EID: 78650853630 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3509384 Document Type: Article

Times cited : (21)

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