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Physical Review Letters

Volumn 103, Issue 18, 2009, Pages

Hard-X-Ray Phase-Difference Microscopy Using a Fresnel Zone Plate and a Transmission Grating

(5) Yashiro, W a Takeda, Y a Takeuchi, A b Suzuki, Y b Momose, A a

a UNIVERSITY OF TOKYO (Japan)

b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BROAD APPLICATION; FRESNEL ZONE PLATE; HARD X RAY; IMAGE MAPPING; LIGHT ELEMENTS; MATERIAL SCIENCE; ORDERS OF MAGNITUDE; PHASE CONTRASTS; PHASE-SENSITIVE; SIMPLE ALGORITHM; SPATIAL RESOLUTION; TRANSMISSION GRATINGS; X RAY MICROSCOPY; X-RAY PHASE;

BIOLOGY; CHEMICAL ELEMENTS; MICROSCOPES;

PHOTODEGRADATION;

EID: 70350532410 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.103.180801 Document Type: Article

Times cited : (72)

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