High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source

Applied Physics Letters

Volumn 90, Issue 22, 2007, Pages

  Engelhardt, Martin ^a   Baumann, Joachim ^b   Schuster, Manfred ^b   Kottler, Christian ^c   Pfeiffer, Franz ^c   Bunk, Oliver ^c   David, Christian ^c  

^a SIEMENS AG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; IMAGE RESOLUTION; INTERFEROMETERS; TOMOGRAPHY; X RAY ANALYSIS;

CONTRAST TOMOGRAPHY; MAGNIFYING PROJECTION GEOMETRY; MICROFOCUS X-RAY SOURCE; PHASE CONTRAST IMAGING;

IMAGING SYSTEMS;

EID: 34249868704     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2743928     Document Type: Article

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