Cross-check of ex-situ and in-situ metrology of a bendable temperature stabilized KB mirror

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 635, Issue 1 SUPPL., 2011, Pages

  Yuan, Sheng ^a   Goldberg, Kenneth A ^a   Yashchuk, Valeriy V ^a   Celestre, Richard ^a   McKinney, Wayne R ^a   Morrison, Gregory ^a   MacDougall, James ^a   Mochi, Iacopo ^a   Warwick, Tony ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Free electron laser; KB mirror; Long trace profiler; Metrology; Optical slope metrology; Shearing interferometry; Synchrotron radiation; Wavefront measurements; X ray

Indexed keywords

KB MIRROR; LONG TRACE PROFILER; METROLOGY; OPTICAL SLOPE METROLOGY; SHEARING INTERFEROMETRY; WAVEFRONT MEASUREMENTS;

ELECTRONS; FREE ELECTRON LASERS; INTERFEROMETRY; LASERS; LIGHT SOURCES; SHEARING; SYNCHROTRON RADIATION; SYNCHROTRONS; UNITS OF MEASUREMENT; WAVEFRONTS;

MIRRORS;

EID: 79952532492     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.09.120     Document Type: Conference Paper

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