Chain-length dependent growth dynamics of n-alkanes on silica investigated by energy-dispersive x-ray reflectivity in situ and in real-time

Journal of Chemical Physics

Volumn 136, Issue 20, 2012, Pages

  Weber, C ^a   Frank, C ^b   Bommel, S ^a,c   Rukat, T ^a   Leitenberger, W ^d   Schafer P ^a   Schreiber, F ^b   Kowarik, S ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

^b UNIVERSITY OF TÜBINGEN   (Germany)

^c DESY   (Germany)

^d UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHAIN-LIKE MOLECULES; DISTINCT POINTS; EHRLICH-SCHWOEBEL BARRIER; ENERGY DISPERSIVE X-RAY; GROWTH DYNAMICS; IN-SITU; ISLAND GROWTH; LAYER-BY-LAYER GROWTH; N-ALKANES; RECIPROCAL SPACE; X-RAY DIFFRACTION MEASUREMENTS;

DYNAMICS; MOLECULAR ORIENTATION; MOLECULES; MONOLAYERS; ORGANIC FIELD EFFECT TRANSISTORS; SILICA; X RAY DIFFRACTION;

PARAFFINS;

EID: 84862564798     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4719530     Document Type: Article

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