Energy-dispersive X-ray reflectivity and GID for real-time growth studies of pentacene thin films

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5606-5610

  Kowarik, S ^a,b   Gerlach, A ^a,b   Leitenberger, W ^c   Hu, J ^a   Witte, G ^d   Woll C ^d   Pietsch, U ^e   Schreiber, F ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF TÜBINGEN   (Germany)

^c UNIVERSITY OF POTSDAM   (Germany)

^d RUHR UNIVERSITY BOCHUM   (Germany)

^e UNIVERSITY OF SIEGEN   (Germany)

Author keywords

Organic semiconductors; Real time monitoring; X ray diffraction; X ray reflectivity

Indexed keywords

BRAGG REFLECTORS; ENERGY DISPERSIVE X RAY ANALYSIS; FILM GROWTH; REAL TIME SYSTEMS; SEMICONDUCTING ORGANIC COMPOUNDS; SURFACE ROUGHNESS; X RAY DIFFRACTION;

GRAZING INCIDENCE DIFFRACTION (GID); REAL TIME MONITORING; X-RAY REFLECTIVITY;

THIN FILMS;

EID: 34247103669     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.020     Document Type: Article

References (29)

1. Krug J., and Michely T. Islands, Mounds and Atoms: Patterns and Processes in Crystal Growth Far From Equilibrium (2004), Springer, Heidelberg
2. Pimpinelli A., and Villain J. Physics of Crystal Growth (1998), Cambridge University Press, Cambridge
3. Krug J. Physica A 340 (2004) 647
4. Schreiber F. Phys. Status Solidi, A Appl. Res. 201 (2004) 1037
5. Brütting W.E. Physics of Organic Semiconductors (2005), Wiley-VCH, Berlin
6. Dürr A.C., Schreiber F., Ritley K.A., Kruppa V., Krug J., Dosch H., and Struth B. Phys. Rev. Lett. 90 (2003) 016104
7. Witte G., and Wöll C. J. Mater. Res. 19 (2004) 1889
8. Kowarik S., Gerlach A., Sellner S., Schreiber F., Cavalcanti L., and Konovalov O. Phys. Rev. Lett. 96 (2006) 125504
9. Braun W., Däweritz L., and Ploog K.H. Phys. Rev. Lett. 80 (1998) 4935
10. Söhnchen S., Lukas S., and Witte G. J. Chem. Phys. 121 (2004) 525
11. Teng H.H., Fenter P., Cheng L., and Sturchio N.C. Geochim. Cosmochim. Acta 65 (2001) 3459
12. Mayer A.C., Ruiz R., Headrick R.L., Kazimirov A., and Malliaras G.G. Org. Electron. 5 (2004) 257
13. Zettler J.T., Haberland K., Zorn M., Pristovsek M., Richter W., Kurpas P., and Weyers M. J. Cryst. Growth 195 (1998) 151
14. Krause B., Schreiber F., Dosch H., Pimpinelli A., and Seeck O.H. Europhys. Lett. 65 (2004) 372
15. Vlieg E., Denier van der Gon A.W., van der Veen J.F., Macdonald J.E., and Norris C. Phys. Rev. Lett. 61 (1988) 2241
16. Nicklin C.L., Everard M.J., Norris C., and Bennett S.L. Phys. Rev., B, Condens. Matter Mater. Phys. 70 (2004) 235413/1
17. Dimitrakopoulos C.D., and Malenfant P.R.L. Adv. Mater. (2002) 99
18. Pietsch U., Grenzer J., Geue T., Neissendorfer F., Brezsesinski G., Symietz C., Möhwald H., and Gudat W. Nucl. Instrum. Methods Phys. Res., Sect. A, Accel. Spectrom. Detect. Assoc. Equip. 467-468 (2001) 1077
19. Ritley K.A., Krause B., Schreiber F., and Dosch H. Rev. Sci. Instrum. 72 (2001) 1453
20. Ruiz R., Mayer A.C., Malliaras G.G., Nickel B., Scoles G., Kazimirov A., Kim H., Headrick R.L., and Islam Z. Appl. Phys. Lett. 85 (2004) 4926
21. Bouchoms I.P.M., Schoonveld W.A., Vrijmoeth J., and Klapwijk T.M. Synth. Met. 104 (1999) 175
22. Yoshikawa G., Miyadera T., Onoki R., Ueno K., Nakai I., Entani S., Ikeda S., Guo D., Kiguchi M., and Kondoh H. Surf. Sci. 600 (2006) 2518
23. S. Kowarik, et al., in preparation.
24. Meyer zu Heringdorf F.J., Reuter M.C., and Tromp R.M. Nature 412 (2001) 517
25. Als-Nielsen J., and McMorrow D. Elements of Modern X-ray Physics (2001), Wiley, New York
26. Mayer A.C., Ruiz R., Zhou H., Headrick R., Kazimirov A., and Malliaras G.G. Phys. Rev., B 73 (2006) 205307
27. Weschke E., Schüβler-Langeheine C., Meier R., Kaindl G., Sutter C., Abernathy D., and Grübel G. Phys. Rev. Lett. 79 (1997) 3954
28. Cohen P.I., Petrich G.S., Pukite P.R., Whaley G.J., and Arrott A.S. Surf. Sci. 216 (1989) 222
29. The limited experimental time resolution was accounted for in the simulations.