The energy-dispersive reflectomeler/diffractometer at BESSY-I

Measurement Science and Technology

Volumn 10, Issue 5, 1999, Pages 354-361

  Neissendorfer, Frank ^a   Pietsch, Ullrich ^a   Brezesinski, Gerald ^b   Möhwald, Helmut ^b  

^a UNIVERSITY OF POTSDAM   (Germany)

^b MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

Interface roughness; Lattice parameter; Layer thickness; Process control of thin film covering; Time resolved structural analysis of thin films and multilayers; X ray diffraction; X ray reflectometry

Indexed keywords

DIFFRACTOMETERS; FATTY ACIDS; INTERFACES (MATERIALS); LATTICE CONSTANTS; PROCESS CONTROL; SPECTRUM ANALYSIS; STORAGE RINGS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

X RAY REFLECTOMETRY/DIFFRACTOMETRY;

REFLECTOMETERS;

EID: 0032658837     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/10/5/003     Document Type: Article

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