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European Physical Journal: Special Topics

Volumn 167, Issue 1, 2009, Pages 11-18

Real-time studies of thin film growth: Measurement and analysis of X-ray growth oscillations beyond the anti-Bragg point

(5) Kowarik, S a,b,c Gerlach, A a,b Skoda, M W A a,b Sellner, S a Schreiber, F a,b

a UNIVERSITY OF TÜBINGEN (Germany)

b UNIVERSITY OF OXFORD (United Kingdom)

c UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 63749117229 PISSN: 19516355 EISSN: 19516401 Source Type: Journal
DOI: 10.1140/epjst/e2009-00930-y Document Type: Article

Times cited : (47)

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