Real-time observation of structural and orientational transitions during growth of organic thin films

Physical Review Letters

Volumn 96, Issue 12, 2006, Pages

  Kowarik, S ^a,b   Gerlach, A ^a,b   Sellner, S ^b,c   Schreiber, F ^a,b   Cavalcanti, L ^d   Konovalov, O ^d  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF TÜBINGEN   (Germany)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); MOLECULAR DYNAMICS; MOLECULAR ORIENTATION; SILICA; STRAIN;

MOLECULAR BEAM DEPOSITION; MOLECULAR THIN FILMS; STRUCTURAL TRANSITIONS;

THIN FILMS;

EID: 33645512599     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.125504     Document Type: Article

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