In-situ X-ray scattering studies of OFET interfaces

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 3, 2008, Pages 461-474

  Gerlach, Alexander ^a   Sellner, Stefan ^a,b,c   Kowarik, Stefan ^a   Schreiber, Frank ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPPING LAYERS; DEVICE APPLICATIONS; GROWTH CONDITIONS; HETEROSTRUCTURES; IN-SITU; INORGANIC INTERFACES; INSULATOR FILMS; INTERDIFFUSION; INTERFACE FORMATIONS; ORGANIC; ORGANIC FIELD EFFECT TRANSISTORS; ORGANIC THIN FILMS; ORGANICS; PENTACENE; ROUGHNESS EVOLUTIONS; SCATTERING TECHNIQUES; THERMAL STABILITIES; THICKNESS REGIMES;

CRYSTAL STRUCTURE; ELECTRONIC PROPERTIES; GROWTH KINETICS; MOLECULAR ORIENTATION; SCATTERING; THERMODYNAMIC STABILITY; THICK FILMS; THIN FILMS; X RAY SCATTERING;

FIELD EFFECT TRANSISTORS;

EID: 54849405402     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200723411     Document Type: Article

References (117)

1. W. E. Brüiting (ed.), Physics of Organic Semiconductors (Wiley-VCH, Weinheim, 2005).
2. R. Farchioni and G. Grosso, Organic Electronic Materials (Springer, Berlin, 2001).
3. G. Horowitz, D. Fichou, X. Peng, Z. Xu, and F. Gamier, Solid State Commun. 72, 381 (1989).
4. C. D. Dimitrakopoulos and P. R. L. Malenfant, Adv. Mater. 14, 99(2002).
5. D. J. Gundlach, Y. Y. Lin, T. N. Jackson, S. F. Nelson, and D. G. Schlom, IEEE Electron Device Lett. 18, 87 (1997).
6. S. Kowarik, A. Gerlach, S. Sellner, F. Schreiber, L. Cavalcanti, and O. Konovalov, Phys. Rev. Lett. 96, 125504 (2006).
7. D. Käfer, L. Ruppel, G, Witte, and C. Wöll, Phys. Rev. Lett. 95, 166602(2005).
8. M. Tolan, X-Ray Scattering from Soft-Matter Thin Films (Springer, Heidelberg, 1999).
9. L. G. Parratt, Phys. Rev. 95, 359 (1954).
10. V. Holý, U. Pietsch, and T. Baumbach, High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer, Berlin, 1999).
11. H. Dosch, Critical Phenomena at Surfaces and Interfaces, Springer Tracts in Modern Physics, Vol. 126 (Springer, Heidelberg, 1999).
12. J. Krug and T. Michely, Islands, Mounds and Atoms: Patterns and Processes in Crystal Growth Far From Equilibrium (Springer, Berlin, 2004).
13. A. Pimpinelli and J. Villain, Physics of Crystal Growth (Cambridge University Press, Cambridge, 1998).
14. I. V. Markov, Crystal Growth for Beginners: Fundamentals of Nucleation, Crystal Growth and Epitaxy (World Scientific, Singapore, 1994).
15. A. L. Barabási and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, 1995).
16. F. Schreiber, phys. stat. sol. (a) 201(6), 1037 (2004).
17. G. Witte and C. Wöll, J. Mater. Res. 19, 1889 (2004).
18. B. Krause, A. C. Dürr, F. Schreiber, H. Dosch, and O. H. Seeck, J. Chem. Phys. 119, 3429 (2003).
19. J. Zegenhagen, Surf. Sci. Rep. 18, 199 (1993).
20. A. Hauschild, K. Karki, B. C. C. Cowie, M. Rohlfing, F. S. Tautz, and M. Sokolowski, Phys. Rev. Lett. 94, 36106 (2005).
21. A. Gerlach, S. Sellner, F. Schreiber, N. Koch, and J. Zegenhagen, Phys. Rev. B 75, 045401 (2007).
22. S. K. M. Henze, O. Bauer, T. L. Lee, M. Sokolowski, and F. S. Tautz, Surf. Sci. 601, 1566 (2007).
23. J. Stanzel, W. Weigand, L. Kilian, H. L. Meyerheim, C. Kumpf, and E. Umbach, Surf. Sci. Lett. 571, 311 (2004).
24. C. Stadler, S. Hansen, A. Schöll, T. L. Lee, J. Zegenhagen, C. Kumpf, and E. Umbach, New J. Phys. 9, 50 (2007).
25. A. Gerlach, F. Schreiber, S. Sellner, H. Dosch, I. A. Vartanyants, B. C. C. Cowie, T. L. Lee, and J. Zegenhagen, Phys. Rev. B 71, 205425 (2005).
26. C. Stadler, S. Hansen, F. Pollinger, C. Kumpf, E. Umbach, T. L. Lee, and J. Zegenhagen, Phys. Rev. B 74, 035404 (2006).
27. R. Woolley, C. Martin, G. Miller, V. Dhanak, and P. Moriarty, Surf. Sci. 601, 1231 (2007).
28. S. Duhm, A. Gerlach, I. Salzmann, B. Bröcker, R. L. Johnson, F. Schreiber, and N.Koch, Org. Electron. 9, 11 (2008).
29. S. C. B. Mannsfeld and T. Fritz, Mod. Phys. Lett. B 20, 585 (2006).
30. A. Hoshino, S. Isoda, and T. Kobayashi, J. Cryst. Growth 115, 826(1991).
31. D. E. Hooks, T. Fritz, and M. D. Ward, Adv. Mater. 13, 227 (2001).
32. F. Schreiber, J. Phys.: Condens. Matter 16, R881 (2004).
33. M. C. Gerstenberg, F. Schreiber, T. Y. B. Leung, G. Bracco, S. R. Forrest, and G. Scoles, Phys. Rev. B 61, 7678 (2000).
34. F. Schreiber, M. C. Gerstenberg, H. Dosch, and G. Scoles, Langmuir 19, 10004 (2003).
35. F. Schreiber, M. C. Gerstenberg, B. Edinger, B. Toperverg, S. R. Forrest, G. Scoles, and H. Dosch, Physica B 283, 75 (2000).
36. A. S. Killampalli, T. W. Schroeder, and J. R. Engstrom, Appl. Phys. Lett. 87, 033110 (2005).
37. D. Käfer, L. Ruppel and G. Witte, Phys. Rev. B 75, 085309 (2007).
38. R. Ruiz, B. Nickel, N. Koch, L. C. Feldman, R. F. Haglund, A. Kahn, and G. Scoles, Phys. Rev. B 67, 125406 (2003).
39. H. Klauk, U. Zschieschang, J. Pflaum, and M. Halik, Nature 445, 745 (2007).
40. C. E. Aumann, R. Kariotis, and M. G. Lagally, J. Vac. Sci. Technol. A 7, 2180 (1989).
41. J. Krug, Adv. Phys. 46, 139 (1997).
42. J. Krug, arXiv cond-mat/0403267 (2004).
43. R. Ruiz, B. Nickel, N. Koch, L. C. Feldman, J. R. F. Haglund, A. Kahn, F. Family, and G. Scoles, Phys. Rev. Lett. 91, 136102(2003).
44. A. C. Dürr, F. Schreiber, V. K. K. A. Ritley, J. Krug, H. Dosch, and B. Struth, Phys. Rev. Lett. 90, 16104 (2003).
45. S. Yim and T. S. Jones, Phys. Rev. B 73, 161305 (2006).
46. M. C. Lafouresse, P. J. Heard, and W. Schwarzacher, Phys. Rev. Lett. 98, 236101 (2007).
47. S. Kowarik, A. Gerlach, S. Sellner, F. Schreiber, J. Pflaum, L. Cavalcanti, and O. Konovalov, Phys. Chem. Chem. Phys. 8, 1834(2006).
48. N. Karl, Charge carrier mobility in organic crystals, in: Organic Electronic Materials, edited by R. Farchioni and G. Grosso (Springer, Berlin, 2001).
49. E. Chason, T. M. Mayer, A. Payne, and D. Wu, Appl. Phys. Lett. 60, 2353(1992).
50. S. Kowarik, A. Gerlach, W. Leitenberger, J. Hu, G. Witte, C. Wöll, U. Pietsch, and F. Schreiber, Thin Solid Films 515, 5606 (2007).
51. R. Ruiz, A. C. Mayer, G. G. Malliaras, B. Nickel, G. Scoles, A. Kazimirov, H. Kim, R. L. Headrick, and Z. Islam, Appl. Phys. Lett. 85, 4926 (2004).
52. R.Ruiz, D. Choudhary, B. Nickel, T. Toccoli, K. C. Chang, A. C. Mayer, P. Clanc, J. M. Blakely, R. L. Headrick, S. Iannotta, and G. G. Malliaras, Chem. Mater. 16, 4497 (2004).
53. K. I. H. Yoshida and N. Sato, Appl. Phys. Lett. 90, 181930 (2007).
54. S. Schiefer, M. Huth, A. Dobinewski, and B. Nickel, J. Am. Chem. Soc. 129, 10316 (2007).
55. S. Pratontep, M. Brinkmann, F. Nuesch, and L. Zuppiroli, Phys. Rev. B 69, 165201 (2004).
56. F. J. Meyer zu Heringdorf, M. C. Reuter, and R. M. Tromp, Nature 412, 517 (2001).
57. L. Casalis, M. F. Danisman, B. Nickel, G. Bracco, T. Toccoli, S. Iannotta, and G. Scoles, Phys. Rev. Lett. 90, 206101 (2003).
58. A. C. Mayer, R. Ruiz, R. L. Headrick, A. Kazimirov, and G. G. Malliaras, Org. Electron. 5, 257 (2004).
59. A. C. Mayer, R. Ruiz, H. Zhou, R. L. Headrick, A. Kazimirov, and G. G. Malliaras, Phys. Rev. B 73, 205307 (2006).
60. A. C. Mayer, A. Kazimirov, and G. G. Malliaras, Phys. Rev. Lett. 97, 105503(2006).
61. I. P. M. Bouchoms, W. A. Schoonveld, J. Vrijmoeth, and T. M. Klapwijk, Synth. Met. 104, 175 (1999).
62. S. Kowarik, A. Gerlach, S. Sellner, M. Skoda, and F. Schreiber, submitted.
63. A. K. Tripathi and J. Pflaum, Appl. Phys. Lett. 89, 082103 (2006).
64. M. Münch, Strukturelle Beeinflussung der elektrischen Transporteigenschaften dünner organischer Schichten, Ph.D. thesis, Universität Stuttgart (2001).
65. V. Pozdin, A. Papadimiraos, and G. Malliaras, private communication (2007).
66. H. E. Simmons, United states patent 4681834: optical recording element (1987).
67. H. Antoniadis and A. J. Bard, United states patent 6004685: LED doped with periflanthene for efficient red emission (1997).
68. A. C. Dürr, F. Schreiber, M. Kelsch, and H. Dosch, Ultramicroscopy 98, 51 (2003).
69. A. C. Dürr, F. Schreiber, M. Münch, N. Karl, B. Krause, V. Kruppa, and H. Dosch, Appl. Phys. Lett. 81(12), 2276 (2002).
70. A. C. Dürr, B. Nickel, V. Sharma, U. Täffner, and H. Dosch, Thin Solid Films 503, 127 (2006).
71. A. C. Dürr, N. Koch, M. Kelsch, A. Rühm, J. Ghijsen, R. L. Johnson, J. J. Pireaux, J. Schwartz, F. Schreiber, H. Dosch, and A. Kahn, Phys. Rev. B 68, 115428 (2003).
72. E. Umbach, Prog. Surf. Sci. 35, 113 (1991).
73. Y. Zou, L. Kilian, A. Schöll, T. Schmidt, R. Fink, and E. Umbach, Surf. Sci. 600, 1240 (2006).
74. L. Kilian, E. Umbach, and M. Sokolowski, Surf. Sci. 573, 359 (2004).
75. B. Krause, A. C. Dürr, F. Schreiber, H. Dosch, and O. H. Seeck, Surf. Sci. 572, 385 (2004).
76. B. Krause, F. Schreiber, H. Dosch, A. Pimpinelli, and O. H. Seeck, Europhys. Lett. 65(3), 372 (2004).
77. B. Krause, A. C. Dürr, K. Ritley, F. Schreiber, H. Dosch, and D. Smilgies, Phys. Rev. B 66, 235404 (2002).
78. B. Krause, A. C. Dürr, K. A. Ritley, F. Schreiber, H. Dosch, and D. Smilgies, Appl. Surf. Sci. 175/176, 332 (2001).
79. B. Krause, Growth and Structure of the Organic Molecule PTCDA on Ag(111), Ph.D. thesis, Universität Stuttgart (2002).
80. M. Eremtchenko, J. Schaefer, and F. S. Tautz, Nature 425, 602 (2003).
81. D. Schlettwein, A. Back, B. Schilling, T. Friz, and N. R. Armstrong, Chem. Mater. 10, 601 (1998).
82. C. Kendrick and A. Kahn, J. Cryst. Growth 181, 181 (1997).
83. L. Kilian, E. Umbach, and M. Sokolowski, Surf. Sci. 600, 2633 (2006).
84. P. Fenter, F. Schreiber, L. Zhou, P. Eisenberger, and S. R. Forrest, Phys. Rev. B 56, 3046 (1997).
85. S. Tan and P. M. Lam, Phys. Rev. B 60, 8314 (1999).
86. A. C. Dürr, F. Schreiber, M. Kelsch, H. D. Carstanjen, and H. Dosch, Adv. Mater. 14, 961 (2002).
87. A. C. Dürr, F. Schreiber, H. D. C. M. Kelsch, H. Dosch, and O. H. Seeck, J. Appl. Phys. 93, 5201 (2003).
88. N. Koch, A. C. Dürr, J. Ghijsen, R. L. Johnson, J. J. Pireaux, J. Schwartz, F. Schreiber, H. Dosch, and A. Kahn, Thin Solid Films 441, 145 (2003).
89. M. Scharnberg, J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, U. Hilleringmann, S. Meyer, and J. Pflaum, Appl. Phys. Lett. 86, 024104 (2005).
90. D. Käfer and G. Witte, Phys. Chem. Chem. Phys. 7, 2850 (2005).
91. M. Kytka, A. Gerlach, F. Schreiber, and J. Kováč, Appl. Phys. Lett. 90(13), 131911 (2007).
92. H. Aziz and Z. D. Popovic, Chem. Mater. 16, 4522 (2004).
93. H. Aziz, Z. Popovic, S. Xie, A. M. Hor, N. X. Hu, C. Tripp, and G. Xu, Appl. Phys. Lett. 72(7), 756 (1998).
94. E. M. Han, L. M. Do, N. Yamamoto, and M. Fujihira, Thin Solid Films 273, 202 (1996),
95. L. M. Do, E. M. Han, Y. Niidome, M. Fujihira, T. Kanno, S. Yoshida, A. Maeda, and A. J. Ikushima, J. Appl. Phys. 76(9), 5118 (1994).
96. H. Aziz, Z. Popovic, C. P. Tripp, N. X. Hu, A.M. Hor, and G. Xu, Appl. Phys. Lett. 72(21), 2642 (1998).
97. S. Hoshino, M. Yoshida, S. Uemura, T. Kodzasa, N. Takada, T. Kamata, and K. Yase, J. Appl. Phys. 95(9), 5088 (2004).
98. S. Ogawa, T. Naijo, Y. Kimura, H. Ishii, and M. Niwano, Appl. Phys. Lett. 86(25), 252104 (2005).
99. C. Pannemann, T. Diekmann, and U. Hilleringmann, J. Mater. Res. 19, 1999 (2004).
100. H. Tian, J. Shi, D. Yan, L. Wang, Y. Geng, and F. Wang, Adv. Mater. 18, 2149(2006).
101. P. E. Burrows, V. Bulovic, S. R. Forrest, L. S. Sapochak, D. M. McCarty, and M. E. Thompson, Appl. Phys. Lett. 65(23), 2922 (1994).
102. C. Pannemann, T. Diekmann, and U. Hilleringmann, 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics (2005), p. 63.
103. J. Lewis and M. Weaver, IEEE J. Sel. Top. Quantum Electron. 10, 45(2004).
104. K. Yamashita, T. Mori, and T. Mizutani, J. Phys. D, Appl. Phys. 34(5), 740 (2001).
105. K. Tsukagoshi, I. Yagi, K. Shigeto, K. Yanagisawa, J. Tanabe, and Y. Aoyagi, Appl. Phys. Lett. 87(18), 183502 (2005).
106. M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, and U. Hilleringmann, Appl. Phys. Lett, 90(1), 013501 (2007).
107. H. Riel, S. Karg, T. Beierlein, W. Riess, and K. Neyts, J. Appl. Phys. 94(8), 5290 (2003).
108. P. Peumans, S. Uchida, and S. R. Forrest, Nature 425, 158 (2003).
109. S. H. K. Park, J. Oh, C. S. Hwang, J. I. Lee, Y. S. Yang, H. Y. Chu, and K. Y. Kang, ETRI J. 27, 545 (2005).
110. A. B. Chwang, M. A. Rothman, S. Y. Mao, R. H. Hewitt, M. S. Weaver, J. A. Silvernail, K. Rajan, M. Hack, J. J. Brown, X. Chu, L. Moro, T. Krajewski, and N. Rutherford, Appl. Phys. Lett. 83(3), 413 (2003).
111. S. Ferrari, F. Perissinotti, E. Peron, L. Fumagalli, D. Natali, and M. Sampietro, Org. Electron. 8, 407 (2007).
112. S. Sellner, A. Gerlach, S. Kowarik, F. Schreiber, H. Dosch, S. Meyer, J. Pflaum, and G. Ulbricht, Thin Solid Films, DOI 10.1016/j.tsf.2007, 12.151.
113. S. Sellner, A. Gerlach, F. Schreiber, M. Kelsch, N. Kasper, H. Dosch, S. Meyer, J. Pflaum, M. Fischer, B. Gompf, and G. Ulbricht, J. Mater. Res. 21, 455 (2005).
114. S. Sellner, A. Gerlach, F. Schreiber, M. Kelsch, N. Kasper, H. Dosch, S. Meyer, J. Pflaum, M. Fischer, and B. Gompf, Adv. Mater. 16, 1750(2004).
115. Y. J. Lee, H. Lee, Y. Byun, S. Song, J. E. Kim, D. Eom, W. Cha, S. S. Park, J. Kim, and H. Kim, Thin Solid Films 515, 5674 (2007).
116. R. G. Munro, J. Am. Ceram. Soc. 80, 1919 (1997).
117. S. Meyer, S. Sellner, F. Schreiber, H. Dosch, G. Ulbricht, M. Fischer, B. Gompf, and J. Pflaum, Mater. Res. Soc. Symp. Proc. 965, 0965-S06-13 (2007).