In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different substrates

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 16, 2005, Pages

  Proehl, Holger ^a   Nitsche, Robert ^a   Dienel, Thomas ^a   Leo, Karl ^a   Fritz, Torsten ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28744451566     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.165207     Document Type: Article

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