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Volumn 97, Issue 6, 2010, Pages

Simultaneous in situ measurements of x-ray reflectivity and optical spectroscopy during organic semiconductor thin film growth

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; COPPER-PHTHALOCYANINE; DIFFERENTIAL REFLECTANCE SPECTROSCOPY; IN-SITU; IN-SITU MEASUREMENT; OPTICAL SPECTROSCOPY; ORGANIC SEMICONDUCTOR THIN FILMS; REAL TIME MEASUREMENTS; SPECTRAL CHANGE; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL CHANGE; SUBMONOLAYER COVERAGE; X RAY REFLECTIVITY;

EID: 77955743964     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3478450     Document Type: Article
Times cited : (31)

References (19)
  • 5
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    • PPCPFQ 1463-9076, and references therein. 10.1039/b814628d
    • R. Forker and T. Fritz, Phys. Chem. Chem. Phys. PPCPFQ 1463-9076 11, 2142 (2009), and references therein. 10.1039/b814628d
    • (2009) Phys. Chem. Chem. Phys. , vol.11 , pp. 2142
    • Forker, R.1    Fritz, T.2
  • 8
    • 33748484483 scopus 로고    scopus 로고
    • Dynamics of bimodal growth in pentacene thin films
    • DOI 10.1103/PhysRevLett.97.105503
    • A. C. Mayer, A. Kazimirov, and G. G. Malliaras, Phys. Rev. Lett. PRLTAO 0031-9007 97, 105503 (2006). 10.1103/PhysRevLett.97.105503 (Pubitemid 44359818)
    • (2006) Physical Review Letters , vol.97 , Issue.10 , pp. 105503
    • Mayer, A.C.1    Kazimirov, A.2    Malliaras, G.G.3
  • 18
    • 48149110077 scopus 로고
    • JVTAD6 0734-2101,. 10.1116/1.577916
    • M. K. Debe, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10, 2816 (1992). 10.1116/1.577916
    • (1992) J. Vac. Sci. Technol. A , vol.10 , pp. 2816
    • Debe, M.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.