A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements

Review of Scientific Instruments

Volumn 72, Issue 2, 2001, Pages 1453-1457

  Ritley, K A ^a   Krause, B ^a   Schreiber, F ^a   Dosch, H ^a  

^a Tosoh SMD Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035247512     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1336822     Document Type: Article

References (27)

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