Overview of reliability testing

IEEE Transactions on Reliability

Volumn 61, Issue 2, 2012, Pages 282-291

  Elsayed, Elsayed A ^a  

^a DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

Degradation modeling; equivalence of test plans; failure modes; maintenance threshold; Reliability testing

Indexed keywords

DEGRADATION DATA; DEGRADATION MODELING; DESIGN OF TEST PLANS; FAILURE DATA; MAINTENANCE DECISIONS; PREDICTION MODEL; RELIABILITY ESTIMATION; RELIABILITY TESTING; TEST DURATION; TEST PLAN;

DEGRADATION; ESTIMATION; FAILURE MODES; MAINTENANCE; MATHEMATICAL MODELS;

RELIABILITY;

EID: 84861874826     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2012.2194190     Document Type: Review

References (55)

1. J. B. Hall, P. M. Ellner, and A. Mosleh, "Reliability growth management metrics and statistical methods for discrete-use systems," Technometrics, vol. 52, pp. 379-408, 2010.
2. A. Fries and A. Sen, "A survey of discrete reliability growth models," IEEE Trans. Reliability, vol. R-45, no. 4, pp. 582-604, 1996. (Pubitemid 126772666)
3. P. E. Acevedo, D. S. Jackson, and R.W. Kotlowitz, "Reliability growth and forecasting for critical hardware through accelerated life testing," Bell Labs Technical Journal, vol. 11, no. 3, pp. 121-135, 2006. (Pubitemid 44832186)
4. E. A. Elsayed, Reliability Engineering. New York: John Wiley and Sons Inc., 2012.
5. W. Lagattolla, "The next generation of environmental testing," Evaluation Engineering, vol. 44, pp. 44-47, 2005. (Pubitemid 40121367)
6. S. Feth, "Partially Passed Component Counting for Evaluating Reliability," Ph.D. dissertation, Technische Universität Kaiserslautern, , Germany, 2009.
7. C. J. Hwan and F. Maxim, "Burn-in for systems operating in a shock environment," IEEE Trans. Reliability, vol. 60, pp. 721-728, 2011.
8. C. J. Hwan and F. Maxim, "Stochastically ordered subpopulations and optimal burn-in procedure," IEEE Trans. Reliability, vol. 59, pp. 635-643, 2010.
9. T. C. Chun, T. S. Tsaing, and B. Narayanaswamy, "Optimal burn-in policy for highly reliable products using gamma degradation process," IEEE Trans. Reliability, vol. 60, pp. 234-245, 2011.
10. Y. Tao and K. Yue, "Bayesian analysis of hazard rate, change point, and cost-optimal burn-in time for electronic devices," IEEE Trans. Reliability, vol. 59, pp. 132-138, 2010.
11. V. Agrawal, C. Kime, and K. Saluja, "A tutorial on built-in-self-Test," in IEEE Design and Test of Computers. Silver Spring, MD: IEEE Computer Society Press, March 1993, pp. 73-80, and pp. 69-77, June 1993.
12. E. A. Elsayed, "Design of Reliability Test Plans: An Overview," in Stochastic Reliability and Maintenance Modeling -Essays in Honor of Professor ShunjiOsaki on his 70th Birthday, T. Dohi andT. Nakagawa, Eds. New York: Springer Publishing, 2012, to appear.
13. D. R. Cox, "Regression models and life tables (with discussion)," Journal of the Royal Statistical Society, Series B, vol. 34, pp. 187-220, 1972.
14. C. J. Dale, "Application of the proportional hazards model in the reliability field," Reliability Engineering, vol. 10, pp. 1-14, 1985. (Pubitemid 15509530)
15. E. A. Elsayed and C. K. Chan, "Estimation of thin-oxide reliability using proportional hazards models," IEEE Trans. Reliability, vol. 39, pp. 329-335, 1990. (Pubitemid 20739258)
16. E. A. Elsayed, H. T. Liao, and X. D. Wang, "An extended linear hazard regression model with application to time-dependent-dielectric-breakdown of thermal oxides," IIE Trans. Quality and Reliability Engineering, vol. 38, pp. 1-12, 2006.
17. A. Ciampi and J. Etezadi-Amoli, "A general model for testing the proportional hazards and the accelerated failure time hypotheses in the analysis of censored survival data with covariates," Commun. Statist. -Theor. Meth., vol. 14, pp. 651-667, 1985.
18. H.-J. Shyur, E. A. Elsayed, and J. T. Luxhoj, "A general model for accelerated life testing with time-dependent covariates," Naval Research Logistics, vol. 46, pp. 303-321, 1999.
19. D. Oakes and T. Dasu, "A note on residual life," Biometrika, vol. 77, pp. 409-410, 1990.
20. W. Brass, Ed., "On the Scale of Mortality," in Biological Aspects of Mortality, Symposia of the Society for the Study of Human Biology. London: Taylor & Francis Ltd., 1971, pp. 69-110.
21. W. Brass, "Mortality models and their uses in demography," Trans. of the Faculty of Actuaries, vol. 33, pp. 122-133, 1974.
22. P. McCullagh, "Regression models for ordinal data," Journal of the Royal Statistical Society. Series B, vol. 42, no. 2, pp. 109-142, 1980.
23. A. Agresti, Categorical Data Analysis. New Jersey: John Wiley & Sons, 2002.
24. D. M. Dabrowska and K. Doksum, "Estimation and testing in a twosample generalized odds-rate model," Journal of the American Statistical Assoc, vol. 83, no. 403, pp. 744-749, 1988.
25. C. O.Wu, "Estimating the real parameter in a two-sample proportional odds model," The Annals of Statistics, vol. 23, no. 2, pp. 376-395, 1995.
26. A. N. Pettitt, "Inference for the linear model using a likelihood based on ranks," Journal of the Royal Statistical Society. Series B, vol. 44, no. 2, pp. 234-243, 1982.
27. A. N. Pettitt, "Proportional odds models for survival data and estimates using ranks," Applied Statistics, vol. 33, no. 2, pp. 169-175, 1984.
28. S. A. Murphy, A. J. Rossini, and A. W. Vaart, "Maximum likelihood estimation in the proportional odds model," Journal of the American Statistical Association, vol. 92, pp. 968-976, 1997.
29. S. Bennett, "Log-logistic regression models for survival data," Applied Statistics, vol. 32, pp. 165-171, 1983.
30. X. Liu and Q. W. S. Qiu, "Modeling and planning of step-stress accelerated life tests with independent competing risks," IEEE Trans. Reliability, vol. 60, pp. 712-720, 2011.
31. T.-H. Fan and W.-L. Wang, "Accelerated life tests for Weibull series systems with masked data," IEEE Trans. Reliability, vol. 60, pp. 557-569, 2011.
32. E. M. Benavides, "Reliability model for step-stress and variable-stress situations," IEEE Trans. Reliability, vol. 60, pp. 219-233, 2011.
33. H. Ma and W. Q. Meeker, "Strategy for planning accelerated life tests with small sample sizes," IEEE Trans. Reliability, vol. 59, pp. 610-619, 2010.
34. G. Yang, "Accelerated life test plans for predicting warranty cost," IEEE Trans. Reliability, vol. 59, pp. 628-634, 2010.
35. M. D. Turner, "A practical application of quantitative accelerated life testing in power systems engineering," IEEE Trans. Reliability, vol. 59, pp. 91-101, 2010.
36. E. A. Elsayed and L. Jiao, "Optimal design of proportional hazards based accelerated life testing plans," International Journal ofMaterials & Product Technology, vol. 17, no. 5/6, pp. 411-424, 2002. (Pubitemid 34586247)
37. W. Q. Meeker and L. A. Escobar, Statistical Methods for Reliability Data. New York: John Wiley & Sons, 1998.
38. W. Q. Meeker, L. A. Escobar, and J. C. Lu, "Accelerated degradation tests: Modeling and analysis," Technometrics, vol. 40, pp. 89-99, 1998. (Pubitemid 128633092)
39. W. B. Nelson, Accelerated Testing: StatisticalMethods, Test Plans, and Data Analysis. New York: John Wiley & Sons, 1990.
40. W. B. Nelson, Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. New York: John Wiley & Sons, 2004.
41. W. B. Nelson, "A bibliography of accelerated test plans," IEEE Trans. Reliability, vol. 54, pp. 194-197, 2005. (Pubitemid 41005018)
42. W. B. Nelson, "A bibliography of accelerated test plans Part II-References," IEEE Trans. Reliability, vol. 54, pp. 370-373, 2005.
43. E. A. Elsayed and H. Zhang, "Design of optimum multiple-stress accelerated life testing plans based on proportional odds model," International Journal of Product Development, vol. 7, no. 3/4, pp. 186-198, 2009.
44. E. A. Elsayed and H. Zhang, "Design of PH-based accelerated life testing plans under multiple-stress-Type," Reliability Engineering and Systems Safety, vol. 92, pp. 286-292, 2007. (Pubitemid 44635161)
45. Y. Zhu and E. A. Elsayed, "Design of equivalent accelerated life testing plan under different stress applications," International Journal of Quality Technology and Quantitative Management, vol. 8, no. 4, pp. 463-478, 2011.
46. H. T. Liao and E. A. Elsayed, "Equivalent accelerated life testing plans and application to reliability prediction," SAE International Journal of Materials and Manufacturing, vol. 3, no. 1, pp. 71-77, 2010.
47. H. Liao and E. A. Elsayed, "Equivalent accelerated life testing plans for log-location-scale distributions," Naval Research Logistics, vol. 57, no. 5, pp. 472-488, 2010.
48. Y. Zhu, "Optimal Design and Equivalency of Accelerated Life Testing Plans," PhD dissertation, Department of Industrial and Systems Engineering, Rutgers University, New Jersey, June 2010.
49. P. A. Tobias and D. Trindade, Applied Reliability. New York: Van Nostrand Reinhold, 1986.
50. J.W. Evans and J. Y. Evans, Development of Acceleration Factors for Testing Mechanical Equipment White Paper. Milford, OH, International TechneGroup Incorporated, ITI Headquarters, 2010.
51. S.-L. Jeng, B.-Y. Huang, and W. Q. Meeker, "Accelerated destructive degradation tests robust to distribution misspecification," IEEE Trans. Reliability, 2011, 10.1109/TR.2011.2161051.
52. , M. S. Nikulin, N. Limnios, N. Balakrishnan, W. Kahle, and C. Huber-Carol, Eds., Advances in Degradation Modeling. Boston, MA: Birkhauser, 2010.
53. L. A. Escobar, F. Guerin,W. Q.Meeker, and M. S. Nikulin, Eds., "Special issue on degradation, damage, fatigue and accelerated life models in reliability testing," Journal of Statistical Planning and Inference, vol. 139, no. 5, pp. 1575-1820, 2009.
54. Y. Shi, L. A. Escobar, and W. Q. Meeker, "Planning accelerated destructive degradation tests," Technometrics, vol. 51, pp. 1-13, 2009.
55. S.-L. Jeng, B.-Y. Huang, and W. Q. Meeker, "Accelerated destructive degradation tests robust to distribution misspecification," IEEE Trans. Reliability, vol. 60, pp. 701-711, 2011.