Modeling and planning of step-stress accelerated life tests with independent competing risks

IEEE Transactions on Reliability

Volumn 60, Issue 4, 2011, Pages 712-720

  Liu, Xiao ^a   Qiu, Wei Shen ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

c optimal; competing risks; D optimal; Ds optimal; Step stress accelerated life test

Indexed keywords

C-OPTIMAL; COMPETING RISKS; D-OPTIMAL; DS-OPTIMAL; STEP-STRESS ACCELERATED LIFE TEST;

NUMERICAL METHODS; SAMPLING; TESTING;

OPTIMIZATION;

EID: 82455187926     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2011.2160748     Document Type: Article

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