Accelerated destructive degradation tests robust to distribution misspecification

IEEE Transactions on Reliability

Volumn 60, Issue 4, 2011, Pages 701-711

  Jeng, Shuen Lin ^a   Huang, Bei Ying ^b   Meeker, William Q ^c  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b Cathay Life Insurance   (Taiwan)

^c Iowa State University   (United States)

Author keywords

Distribution misspecification; lognormal; mean square error; robust test plan; Weibull

Indexed keywords

LOG-NORMAL; MEAN SQUARE; MISSPECIFICATION; ROBUST TEST PLAN; WEIBULL;

CODES (SYMBOLS); DEGRADATION; MEAN SQUARE ERROR; TESTING;

WEIBULL DISTRIBUTION;

EID: 82455162366     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2011.2161051     Document Type: Article

References (12)

1. C. H. Chiao and M. Hamada, "Robust Reliability for Light Emitting Diodes Using Degradation Measurements" Quality and Reliability Engineering International, vol. 12, pp. 89-94, 1996.
2. M. T. Chao, "Degradation Analysis and Related Topics: Some Thoughts and a Review" Proceedings of the National Science Council, vol. 23, pp. 555-566, 1999.
3. L. A. Escobar,W. Q. Meeker, D. L. Kugler, and L. L. Kramer, Accelerated Destructive Degradation Tests: Data, Models, and Analysis, B. H. Lindqvist and K. A. Doksum, Eds. River Edge, NJ: World Scientific Publishing Company, 2003, Chapter 21 in Mathematical and Statistical Methods in Reliavility.
4. C. J. Lu and W. Q. Meeker, "Using Degradation Measures to Estimate a Time-to-Failure Distribution" Technometrics, vol. 35, pp. 161-174, 1993.
5. C. A. Meeter and W. Q. Meeker, "Optimum Accelerated Life Tests with a Nonconstant Scale Parameter" Technometrics, vol. 35, pp. 71-83, 1994.
6. W. Q. Meeker, L. A. Escobar, and C. J. Lu, "Accelerated Degradation Tests: Modeling and Analysis" Technometrics, vol. 40, pp. 89-99, 1998.
7. W. Nelson, Acceleratd Testing: Statistical Model, Test Plans, and Data Analyses. New York: Wiley, 1990.
8. W. Nelson, "A Bibliography of Accelerated Test Plans" IEEE Trans. Rel., vol. 54, pp. 194-197, 2005.
9. W. Nelson, "Bibliography of Accelerated Test Plans Part II References" IEEE Trans. Rel., vol. 54, pp. 370-373, 2005.
10. F. G. Pascual and G. Montepiedra, "Lognormal and Weibull Accelerated Life Test Plans Under Distribution Misspecification" IEEE Trans. Rel., vol. 54, pp. 43-52, 2005.
11. Y. Shi, W. Q. Meeker, and L. A. Escobar, "Accelerated Destructive Degradation Test Planning" Technometrics, vol. 51, pp. 1-13, 2009.
12. H. White, "Maximum Likelihood Estimation of Misspecified Models" Econometrica, vol. 50, pp. 1-26, 1982.