A Bibliography of Accelerated Test Plans Part II—References

IEEE Transactions on Reliability

Volumn 54, Issue 3, 2005, Pages 370-373

  Nelson, Wayne B ^a  

^a Schenectady   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85008060887     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.2005.853289     Document Type: Article

References (159)

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