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Volumn 57, Issue 5, 2010, Pages 472-488

Equivalent accelerated life testing plans for log-location-scale distributions

Author keywords

Equivalency; Log location scale distributions; Optimal ALT plans; Type I censoring

Indexed keywords

ACCELERATED LIFE TESTING; CONSTANT STRESS; FAILURE-TIME DISTRIBUTION; LOCATION-SCALE DISTRIBUTIONS; NORMAL OPERATING CONDITIONS; STEP-STRESS; STRESS LOADING; TYPE-I CENSORING;

EID: 77955443010     PISSN: 0894069X     EISSN: 15206750     Source Type: Journal    
DOI: 10.1002/nav.20415     Document Type: Article
Times cited : (35)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.