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Volumn 59, Issue 1, 2010, Pages 91-101

A practical application of quantitative accelerated life testing in power systems engineering

Author keywords

Accelerated testing; Power system testing; Reliability demonstration testing

Indexed keywords

ACCELERATED LIFE TESTING; ACCELERATED TESTING; DEVELOPMENT TIME; ENGINEERING ORGANIZATIONS; POWER SYSTEM TESTING; POWER SYSTEMS; PRODUCT RELIABILITY; RELIABILITY ASSESSMENTS; RELIABILITY DATA; RELIABILITY DEMONSTRATION; RESOURCE CONSTRAINT; RESOURCE DEMANDS; TEST DURATION;

EID: 77949264855     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2010.2040533     Document Type: Article
Times cited : (24)

References (8)
  • 1
    • 77949267291 scopus 로고    scopus 로고
    • Accelerated Life Testing Reference, 2007, pp. 14-19, Reliasoft Publishing.
    • "Accelerated Life Testing Reference," 2007, pp. 14-19, Reliasoft Publishing.
  • 2
    • 77949267290 scopus 로고    scopus 로고
    • Telcordia Technologies Inc., Telcordia SR-332, Reliability Procedure for Electronic Equipment Issue, September 2, 2006.
    • Telcordia Technologies Inc., "Telcordia SR-332," Reliability Procedure for Electronic Equipment Issue, September 2, 2006.
  • 3
    • 77949267292 scopus 로고    scopus 로고
    • Accelerated Life Testing Reference, 2007, pp. 321-322, Reliasoft Publishing.
    • "Accelerated Life Testing Reference," 2007, pp. 321-322, Reliasoft Publishing.
  • 5
    • 33644900705 scopus 로고    scopus 로고
    • Optimal design for step-stress accelerated tests
    • Mar
    • C.-M. Liao and S.-T. Tseng, "Optimal design for step-stress accelerated tests," IEEE Trans. Reliability, vol. 55, no. 1, Mar. 2006.
    • (2006) IEEE Trans. Reliability , vol.55 , Issue.1
    • Liao, C.-M.1    Tseng, S.-T.2
  • 7
    • 0030109470 scopus 로고    scopus 로고
    • Robust reliabilty for light emitting diodes using degradation measurements
    • C. Chiao and M. Hamada, "Robust reliabilty for light emitting diodes using degradation measurements," Quality and Reliability Engineering International, vol. 12, pp. 89-94, 1996.
    • (1996) Quality and Reliability Engineering International , vol.12 , pp. 89-94
    • Chiao, C.1    Hamada, M.2
  • 8
    • 77949269103 scopus 로고    scopus 로고
    • Accelerated Life Testing Reference, 2007, pp. 269-270, Reliasoft Publishing.
    • "Accelerated Life Testing Reference," 2007, pp. 269-270, Reliasoft Publishing.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.