Accelerated Degradation Tests: Modeling and Analysis

Technometrics

Volumn 40, Issue 2, 1998, Pages 89-99

  Meeker, William Q ^a   Escobar, Luis A ^b   Lu, C Joseph ^c  

^a Iowa State University of Science and Technology   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

^c NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Bootstrap; Maximum likelihood; Mixed effects; Nonlinear estimation; Random effects; Reliability

Indexed keywords

DETERIORATION; ESTIMATION; MATHEMATICAL MODELS; RANDOM PROCESSES; REGRESSION ANALYSIS; RELIABILITY; THERMAL EFFECTS;

ACCELERATED DEGRADATION TESTS; BOOTSTRAP METHOD; MAXIMUM LIKELIHOOD METHOD;

FAILURE ANALYSIS;

EID: 0032071686     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1998.10485191     Document Type: Article

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