A survey of discrete reliability-growth models

IEEE Transactions on Reliability

Volumn 45, Issue 4, 1996, Pages 582-604

  Fries, A ^a  

^a INSTITUTE FOR DEFENSE ANALYSES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; STATISTICAL METHODS;

BAYES INTERVAL LIMIT; DISCRETE RELIABILITY GROWTH MODELS;

RELIABILITY;

EID: 0030394645     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.556581     Document Type: Article

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