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Volumn 38, Issue 4, 2006, Pages 329-340

An extended linear hazard regression model with application to time-dependent dielectric breakdown of thermal oxides

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; FAILURE ANALYSIS; REGRESSION ANALYSIS; RELIABILITY;

EID: 33644630247     PISSN: 0740817X     EISSN: None     Source Type: Journal    
DOI: 10.1080/07408170500208362     Document Type: Article
Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.