Accelerated life test plans for predicting warranty cost

IEEE Transactions on Reliability

Volumn 59, Issue 4, 2010, Pages 628-634

  Yang, Guangbin ^a  

^a FORD MOTOR COMPANY   (United States)

Author keywords

Accelerated life test; minimal repair; non homogeneous Poisson process; test plan; warranty cost

Indexed keywords

ACCELERATED LIFE TESTS; MINIMAL REPAIR; NON-HOMOGENEOUS POISSON PROCESS; TEST PLAN; WARRANTY COSTS;

ASYMPTOTIC ANALYSIS; CONSUMER PRODUCTS; COSTS; FORECASTING; MAXIMUM LIKELIHOOD ESTIMATION; POISSON DISTRIBUTION; TESTING;

COST BENEFIT ANALYSIS;

EID: 78649796489     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2010.2085550     Document Type: Article

References (14)

1. G. Yang, Life Cycle Reliability Engineering. Hoboken, NJ: John Wiley and Sons, 2007.
2. W. B. Nelson, Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. Hoboken, NJ: John Wiley and Sons, 1990, and 2004 (paperback edition with updated software description).
3. W. Q. Meeker and L. A. Escobar, Statistical Methods for Reliability Data. Hoboken, NJ: John Wiley and Sons, 1998.
4. W. Q. Meeker, L. A. Escobar, and Y. Hong, "Using accelerated life tests to predict product field reliability," Technometrics, Vol. 51, no. 2, pp. 146-161, 2009.
5. W. B. Nelson, "Prediction of field reliability of units, each under differing dynamic stresses, from accelerated test data," in Handbook of Statistics, N. Balakrishnan and C. R. Rao, Eds. Amsterdam, North-Holland:, 2001.
6. J. Baik and D. N. P. Murthy, "Reliability assessment based on two-dimensional warranty data and an accelerated failure time model," International Journal of Reliability and Safety, Vol. 2, no. 3, pp. 190-208, 2008.
7. W. B. Nelson, "A bibliography of accelerated test plans, Part I - Overview," IEEE Trans. Reliability, Vol. 54, no. 2, pp. 194-197, Jun. 2005.
8. W. B. Nelson, "A bibliography of accelerated test plans, Part II - References," IEEE Trans. Reliability, Vol. 54, no. 3, pp. 370-373, Sep. 2005, Request a searchable updated Word file with added references from WNconsult@aol.com.
9. W. R. Blischke and D. N. P. Murthy, Warranty Cost Analysis. New York: Marcel Dekker, 1995.
10. V. Krivtsov, "Practical extensions to NHPP application in repairable system reliability analysis," Reliability Engineering and System Safety, Vol. 92, no. 5, pp. 560-562, 2007.
11. G. Yang and L. Jin, "Best compromise test plans for Weibull distributions with different censoring times," Quality and Reliability Engineering International, Vol. 10, no. 5, pp. 411-415, 1994.
12. W. Q. Meeker, "A comparison of accelerated life test plans for Weibull and lognormal distributions and type I censoring," Technometrics, Vol. 26, no. 2, pp. 157-171, 1984.
13. G. Yang, "Accelerated life test at higher usage rates," IEEE Trans. Reliability, Vol. 54, no. 1, pp. 53-57, Mar. 2005.
14. L. C. Tang and K. Xu, "A multiple objective framework for planning accelerated life tests," IEEE Trans. Reliability, Vol. 54, no. 1, pp. 58-63, Mar. 2005.